MX29F001T Macronix, MX29F001T Datasheet - Page 14

• Manufacturer Part Number: MX29F001T
• Description: 1M bit CMOS Flash Memory
• Manufacturer: Macronix

AC CHARACTERISTICS
TEST CONDITIONS:
• Input pulse levels: 0.45V/2.4V for 70ns max. ; 0V/3.0V
• Input rise and fall times: <10ns for 70ns max; <5ns for
• Output load: 1 TTL gate + 100pF (Including scope and
• Reference levels for measuring timing : 0.8V & 2.0V for
P/N: PM0515
for 55ns
55ns
jig) for 70ns max. ; 1 TTL gate + 30pF (Including scope
and jig) for 55ns max.
70ns max.; 1.5V for 55ns
SYMBOL PARAMETER
tACC
tCE
tOE
tDF
tOH
SYMBOL PARAMETER
tACC
tCE
tOE
tDF
tOH
Address to Output Delay
CE to Output Delay
OE to Output Delay
OE High to Output Float (Note1)
Address to Output hold
Address to Output Delay
CE to Output Delay
OE to Output Delay
OE High to Output Float (Note1)
Address to Output hold
VCC = 5V ± 10% (5V ± 5% for MX29F001T/B-55)
29F001T/B-55
MIN.
0
0
29F001T/B-90
MIN.
0
0
14
NOTE:
1. tDF is defined as the time at which the output achieves
MAX.
55
55
30
20
MAX.
90
90
40
30
the open circuit condition and data is no longer driven.
0
0
29F001T/B-70
MIN.
0
29F001T/B-12
MIN.
0
MX29F001T/B
MAX.
70
70
40
20
MAX.
120
120
50
30
UNIT
UNIT
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
CE=OE=VIL
CE=VIL
CE=VIL
CE=OE=VIL
CE=OE=VIL
CE=VIL
CE=VIL
CE=OE=VIL
CONDITIONS
OE=VIL
CONDITIONS
OE=VIL
REV. 2.5,NOV. 20, 2002