cy25c01 Cypress Semiconductor Corporation., cy25c01 Datasheet - Page 10

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cy25c01

Manufacturer Part Number
cy25c01
Description
1 Kbit, 2 Kbit, 4 Kbit, 8 Kbit, And 16 Kbit X8 Spi Serial Eeprom
Manufacturer
Cypress Semiconductor Corporation.
Datasheet
Capacitance
In the following table, the capacitance parameters are listed.
Thermal Resistance
In the following table, the thermal resistance parameters are listed.
Reliability Characteristics
In the following table, the reliability characteristics parameters are listed.
AC test inputs are driven at V
and outputs are V
Note
Document #: 001-15633 Rev. *C
C
C
N
T
I
5. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
LTH
DR
IN
OUT
END
Parameter
Θ
Θ
Parameter
Parameter
Parameters
JA
JC
R1
R2
C
V
V
L
IHT
ILT
Thermal Resistance
(Junction to Ambient)
Thermal Resistance
(Junction to Case)
LT
(V
Description
CC
INPUT
Input Capacitance
Output Pin Capacitance
Endurance
Data Rentention
Latch Up
/2 - 0.1V) and V
IHT
(0.9V
Frequency
20/10 MHz
20/10 MHz
Description
Description
20 MHz
10 MHz
CC
Figure 11. AC Input/Output Reference Waveforms
OUTPUT
Test conditions follow standard test methods and proce-
dures for measuring thermal impedance, per EIA /
JESD51.
) for a logic “1” and V
HT
Figure 10. AC Test Loads and Waveforms
(V
CC
VCC
V
V
/2 + 0.1V). Input rise and fall times (10%–90%) are <20 ns
HT
LT
T
V
JEDEC Standard A117
JEDEC Standard A103
JEDEC Standard 78
A
CC
Test Conditions
1.8V - 2.7V
= 25°C, f = 1 MHz,
[5]
REFERENCE POINTS
= 5.5V
C
ILT
1.8K
1.3K
L
30
(0.1V
-
[5]
Test Conditions
Test Method
CC
[5]
R1
) for a logic “0”. Measurement reference points for inputs
2.7V - 5.5V
R2
V
V
1.8K
1.3K
HT
LT
30
CY25C01/02/04/08/16
100 + I
8-SOIC
1 Million
120.83
90.31
Max
Min
100
6
8
OUTPUT
CC
8-TSSOP
119.31
82.77
Unit
pF
Ω
Ω
Page 10 of 17
Cycles
Years
Unit
Unit
mA
pF
pF
°C/W
°C/W
Unit
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