ade7169f16 Analog Devices, Inc., ade7169f16 Datasheet - Page 18
![no-image](/images/no-image-200.jpg)
ade7169f16
Manufacturer Part Number
ade7169f16
Description
Single-phase Energy Measurement Ic With 8052 Mcu, Rtc And Lcd Driver
Manufacturer
Analog Devices, Inc.
Datasheet
1.ADE7169F16.pdf
(140 pages)
- Current page: 18 of 140
- Download datasheet (2Mb)
ADE7169F16
ABSOLUTE MAXIMUM RATINGS
T
Table 9.
Parameter
V
V
V
Input LCD voltage to AGND
Analog Input Voltage to AGND
Digital Input Voltage to DGND
Digital Output Voltage to DGND
Operating Temperature Range
Storage Temperature Range
Junction Temperature
64-Lead LQFP, Power Dissipation
64-Lead CSP, Power Dissipation
1
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
When used with external resistor divider
DD
BAT
DCIN
A
V
= 25°C, unless otherwise noted.
to DGND
P
to DGND
, V
LCDVA, LCDVB, LCDVC
Industrial
θ
Lead Temperature, Soldering
θJA Thermal Impedance
Lead Temperature, Soldering
to DGND
JA
N
, I
Thermal Impedance
AP
Vapor Phase (TBD sec)
Infrared (TBD sec)
Vapor Phase (TBD sec)
Infrared (TBD sec)
, I
BPN
and I
N
1
Rating
–0.3 V to +3.7 V
–0.3 V to +3.7 V
–0.3 V to V
–0.3 V to V
–2 V to +2 V
–0.3 V to V
–0.3 V to V
–40°C to +85°C
–65°C to +150°C
TBD°C
TBD
TBD°C/W
TBD°C
TBD°C
TBD
TBD°C/W
TBD°C
TBD°C
SWOUT
SWOUT
SWOUT
SWOUT
+ 0.3 V
+ 0.3 V
+ 0.3 V
+ 0.3 V
Rev. PrD | Page 18 of 140
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or
any other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Preliminary Technical Data
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