mpc5644a Freescale Semiconductor, Inc, mpc5644a Datasheet - Page 78

• Manufacturer Part Number: mpc5644a
• Description: Mpc5644a Microcontroller Data Sheet
• Manufacturer: Freescale Semiconductor, Inc

Electrical characteristics
3.4
3.5
78
•
1
1
Radiated
emissions,
electric field
EMI testing and I/O port waveforms per SAE J1752/3 issued 1995-03 and IEC 61967-2.
All ESD testing is in conformity with CDF-AEC-Q100 Stress Test Qualification for Automotive Grade Integrated
Circuits.
B. Joiner and V. Adams, “Measurement and Simulation of Junction to Board Thermal Resistance and Its Application
in Thermal Modeling,” Proceedings of SemiTherm, San Diego, 1999, pp. 212-220.
Symbol
R1
EMI (electromagnetic interference) characteristics
Electrostatic discharge (ESD) characteristics
—
—
—
—
C
Symbol
SR
SR
SR
SR
SR
SR
V
Parameter
RE_TEM
ESD for Human Body Model (HBM)
HBM circuit description
ESD for field induced charge Model
(FDCM)
Number of pulses per pin
Number of pulses
Preliminary—Subject to Change Without Notice
V
T
150 kHz – 30 MHz
RBW 9 kHz, Step
Size 5kHz
30 MHz – 1 GHz -
RBW 120 kHz, Step
Size 80 kHz
MPC5644A Microcontroller Data Sheet, Rev. 4
A
DDREG
Table 12. EMI Testing Specifications
= +25 °C
Conditions
Parameter
= 5.25 V;
Table 13. ESD ratings
No PLL frequency
16 MHz crystal
16 MHz crystal
40 MHz bus
40 MHz bus
modulation
modulation
frequency
f
±2% PLL
OSC
/f
BUS
All pins
Corner pins
Positive pulses (HBM)
Negative pulses (HBM)
1,2
150 kHz – 50 MHz
150 kHz– 50 MHz
500 – 1000 MHz
500 – 1000 MHz
150 – 500 MHz
150 – 500 MHz
Conditions
50 – 150 MHz
50 – 150 MHz
Frequency
SAE Level
SAE Level
IEC Level
IEC Level
1
—
—
—
—
Freescale Semiconductor
(Max)
Level
20
20
26
26
13
13
11
13
Value
K
3
L
2
2000
1500
100
500
750
1
1
1
dBV
dBV
Unit
Unit
—
—
—
—
pF
—
—
—
V

V