mc33662 Freescale Semiconductor, Inc, mc33662 Datasheet - Page 7

• Manufacturer Part Number: mc33662
• Description: Lin 2.1 / Saej2602-2, Lin Physical Layer
• Manufacturer: Freescale Semiconductor, Inc

Analog Integrated Circuit Device Data
Freescale Semiconductor
Table 4. Limits / Maximum Test Voltage for Transient Immunity Tests
Test Pulse
2a
3a
3b
1
V
+100
-100
-150
+75
S
[V]
DUT GND
Figure 5. Test Circuit for Transient Test Pulses (WAKE)
Figure 4. Test Circuit for Transient Test Pulses (VSUP)
Figure 6. Test Circuit for Transient Test Pulses (LIN)
DUT GND
DUT GND
DUT
DUT
DUT
Pulse repetition
frequency [Hz]
WAKE
10000
10000
(1/T
VSUP
Note Waveform per ISO 7637-2. Test Pulses 1, 2a, 3a, 3b.
2
2
LIN
1
)
18 k
Note Waveform per ISO 7637-2. Test Pulses 1, 2a, 3a, 3b.
10 µF
Test Duration [min]
1.0 nF
10 for damage test
1 for function test
D1
Note Waveform per ISO 7637-2. Test Pulses 1, 2a, 3a, 3b.
18 k
1.0 nF
Transient Pulse
Transient Pulse
Generator
Generator
(Note)
(Note)
GND
GND
Transient Pulse
Generator
(Note)
GND
R
i
10
50
50
2
[Ω]
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
Remarks
t
2
= 0 s
33662
7