lh28f640sp Sharp Microelectronics of the Americas, lh28f640sp Datasheet - Page 20

• Manufacturer Part Number: lh28f640sp
• Description: Flash Memory 64mbit 4mbitx16
• Manufacturer: Sharp Microelectronics of the Americas

1.2.1 Capacitance
NOTE:
1. Sampled, not 100% tested.
1.2.2 AC Input/Output Test Conditions
Symbol
Figure 5. Transient Equivalent Testing Load Circuit
C
C
OUT
IN
V
DEVICE
UNDER
CCQ
0.0
CL Includes Jig
TEST
AC test inputs are driven at V
Input timing begins, and output timing ends at V
Worst case speed conditions are when V
Capacitances.
Input Capacitance
Output Capacitance
(1)
Figure 4. Transient Input/Output Reference Waveform for V
(T
INPUT
Parameter
A
V
=+25°C, f=1MHz)
CCQ
(min)/2
1N914
R L =3.3kΩ
C L
V
CCQ
CCQ
OUT
/2
(min) for a Logic "1" and 0.0V for a Logic "0".
Min.
CC
=V
LHF64PZ8
CC
TEST POINTS
(min).
CCQ
/2. Input rise and fall times (10% to 90%) < 5ns.
Typ.
6
8
Table 10. Configuration Capacitance Loading Value
Test Configuration
V
Max.
CC
12
8
=2.7V-3.6V
CC
=2.7V-3.6V
Unit
pF
pF
V
CCQ
/2
OUTPUT
V
V
Condition
OUT
IN
=0.0V
C
=0.0V
L
30
Rev. 0.06
(pF)
17