hcs32dmsr Intersil Corporation, hcs32dmsr Datasheet - Page 6

• Manufacturer Part Number: hcs32dmsr
• Description: Rad-hard Quad 2-input Or Gate
• Manufacturer: Intersil Corporation

Total Dose Irradiation
NOTES:
Static And Dynamic Burn-In Test Connections
NOTES:
Irradiation Test Conditions
NOTES:
13. Except FN test which will be performed 100% Go/No-Go.
14. Each pin except VCC and GND will have a resistor of 10kΩ ± 5% for static burn-in
15. Each pin except VCC and GND will have a resistor of 1kΩ ± 5% for dynamic burn-in
16. Each pin except VCC and GND will have a resistor of 47KΩ ± 5% for irradiation testing. Group E, Subgroup 2, sample size is 4 dice/wafer 0
STATIC BURN-IN I TEST CONNECTIONS (Note 14)
STATIC BURN-IN II TEST CONNECTIONS (Note 14)
DYNAMIC BURN-IN TEST CONNECTIONS (Note 15)
Group E Subgroup 2
CONFORMANCE GROUPS
failures.
3, 6, 8, 11
3, 6, 8, 11
OPEN
-
3, 6, 8, 11
OPEN
1, 2, 4, 5, 7, 9, 10, 12,
GROUND
6
13
7
7
METHOD
5005
1/2 VCC = 3V ± 0.5V
PRE RAD
1, 7, 9
GROUND
3, 6, 8, 11
7
-
-
HCS32MS
Characteristics on page 4
TEST
Electrical Performance
DC Post Radiation
1, 2, 4, 5, 9, 10, 12, 13,
POST RAD
VCC = 6V ± 0.5V
14
14
14
1, 2, 4, 5, 9, 10, 12, 13, 14
1, 2, 4, 5, 9, 10, 12,
PRE RAD
VCC = 5V ± 0.5V
1, 9
50kHz
13
READ AND RECORD
-
-
OSCILLATOR
Electrical Performance
DC Post Radiation
Characteristics on
page 4 (Note 13)
POST RAD
25kHz
-
-
-
April 11, 2007
FN3057.1