hcts574ms Intersil Corporation, hcts574ms Datasheet - Page 6

• Manufacturer Part Number: hcts574ms
• Description: Radiation Hardened Octal D-type Flip-flop, Three-state, Positive Edge Triggered
• Manufacturer: Intersil Corporation

NOTE:
NOTE:
NOTES:
1. Alternate Group A testing in accordance with Method 5005 of MIL-STD-883 may be exercised.
1. Except FN test which will be performed 100% Go/No-Go.
1. Each pin except VCC and GND will have a resistor of 10K
2. Each pin except VCC and GND will have a resistor of 680
Initial Test (Preburn-In)
Interim Test I (Postburn-In)
Interim Test II (Postburn-In)
PDA
Interim Test III (Postburn-In)
PDA
Final Test
Group A (Note 1)
Group B
Group D
Group E Subgroup 2
STATIC BURN-IN I TEST CONNECTIONS (Note 1)
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)
12 - 19
12 - 19
OPEN
CONFORMANCE
-
CONFORMANCE GROUPS
GROUPS
NOTE: Each pin except VCC and GND will have a resistor of 47K
GROUND
1 - 11
1, 10
Subgroup B-5
Subgroup B-6
10
TABLE 8. STATIC BURN-IN AND DYNAMIC BURN-IN TEST CONNECTIONS
testing. Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
METHOD
12 - 19
OPEN
5005
TABLE 9. IRRADIATION TEST CONNECTIONS
1/2 VCC = 3V
Specifications HCTS574MS
TABLE 7. TOTAL DOSE IRRADIATION
TABLE 6. APPLICABLE SUBGROUPS
Sample/5005
Sample/5005
Sample/5005
Sample/5005
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
METHOD
PRE RAD
12 - 19
1, 7, 9
-
-
GROUND
0.5V
10
5% for dynamic burn-in.
5% for static burn-in.
699
TEST
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
1, 2, 3, 7, 8A, 8B, 9, 10, 11
GROUP A SUBGROUPS
POST RAD
VCC = 6V
2, 3, 8A, 8B, 10, 11
Table 4
1 - 9, 11, 20
1, 7, 9, Deltas
1, 7, 9, Deltas
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
20
20
VCC = 5V
0.5V
1 - 9, 11, 20
5% for irradiation
PRE RAD
0.5V
1, 9
READ AND RECORD
50kHz
ICC, IOL/H
ICC, IOL/H
ICC, IOL/H
ICC, IOL/H
Subgroups 1, 2, 3, 9, 10, 11
11
-
-
READ AND RECORD
OSCILLATOR
Spec Number
Table 4 (Note 1)
POST RAD
25kHz
2 - 9
-
-
518629