k7r321882m Samsung Semiconductor, Inc., k7r321882m Datasheet - Page 13

no-image

k7r321882m

Manufacturer Part Number
k7r321882m
Description
1mx36-bit, 2mx18-bit, 4mx9-bit Qdrtm Ii B2 Sram
Manufacturer
Samsung Semiconductor, Inc.
Datasheet

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
k7r321882m-EC20
Manufacturer:
SAMSUNG
Quantity:
1 700
Part Number:
k7r321882m-EC25
Manufacturer:
SAMSUNG
Quantity:
1 702
Part Number:
k7r321882m-EI25
Manufacturer:
SAMSUNG
Quantity:
1 708
Part Number:
k7r321882m-FC16
Manufacturer:
SAMSUNG
Quantity:
12 325
Part Number:
k7r321882m-FC20
Manufacturer:
SAMSUNG
Quantity:
12 330
Company:
Part Number:
k7r321882m-FC20
Quantity:
175
K7R323682M
K7R321882M
K7R320982M
THERMAL RESISTANCE
Note: Junction temperature is a function of on-chip power dissipation, package thermal impedance, mounting site temperature and mounting site
PIN CAPACITANCE
Note: 1. Parameters are tested with RQ=250
APPLICATION INRORMATION
Junction to Ambient
Junction to Case
Junction to Pins
MEMORY
CONTROLLER
Address Control Input Capacitance
Input and Output Capacitance
Clock Capacitance
thermal impedance. T
2. Periodically sampled and not 100% tested.
SRAM1 Input CQ
SRAM1 Input CQ
SRAM4 Input CQ
SRAM4 Input CQ
Source CLK
Source CLK
Return CLK
Return CLK
Data Out
Address
PRMETER
Data In
PRMETER
BW
W
R
J
=T
A
Vt
+ P
R
R=50
D
x
JA
Vt
Vt
Vt=V
D
SA
and V
REF
R W BW
DDQ
SYMBOL
=1.5V.
C
C
C
OUT
CLK
1Mx36 & 2Mx18 & 4Mx9 QDR
IN
SRAM#1
SYMBOL
0
JC
JA
JB
BW
1
- 13 -
TESTCONDITION
C C
V
V
OUT
K
IN
CQ
CQ
Q
ZQ R=250
=0V
-
K
=0V
20.8
Typ
2.3
4.3
Typ
D
SA
R
4
6
5
Vt
Vt
RW BW
Max
5
7
6
SRAM#4
TM
0
Unit
C
C
C
BW
/W
/W
/W
II b2 SRAM
Unit
pF
pF
pF
1
C C
NOTES
Dec. 2003
NOTES
K
CQ
ZQ
CQ
ZQ
Q
Rev 2.0
K
R=250

Related parts for k7r321882m