TSS461CVAN TEMIC [TEMIC Semiconductors], TSS461CVAN Datasheet - Page 19

• Manufacturer Part Number: TSS461CVAN
• Description: Van Controller Serial Interface
• Manufacturer: TEMIC [TEMIC Semiconductors]

4.5.5 EFR (Early Failure Rate)
The EFR is measured on a sample of devices by operating them at an elevated temperature and
measuring the number which fails to meet specification after 12 hours at 150°C. The figure is expressed
in terms of ppm.
4.5.6 LFR (Latent Failure Rate)
The LFR is measured by operating devices at elevated temperatures for 1000 hours and measuring the
failure rate. Using the Arrhenius law, the expected failure rate at a operating temperature of 55°C is
calculated using an activation Energy of 0.6 eV with a confidence level of 60%. This is expressed in units
per billion hours (FIT).
Rev. 2 – January 1999
100
80
60
40
20
0
1000
800
600
400
200
0
1991
1991
1992
1992
1993
1993
1994
1994
Year
Year
1995
1995
Qualpack TSS463 / TSS461C
1996
1996
1997
1997
1998 (Obj)
1998 (Obj)
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