CY7C1041CV33 Cypress Semiconductor, CY7C1041CV33 Datasheet - Page 5

• Manufacturer Part Number: CY7C1041CV33
• Description: 256K x 16 Static RAM
• Manufacturer: Cypress Semiconductor

AC Test Loads and Waveforms
Switching Waveforms
Notes:
Document #: 38-05134 Rev. *D
10. AC characteristics (except High-Z) for all 8-ns and 10-ns parts are tested using the load conditions shown in Figure (a). All other speeds are tested using the
11. Device is continuously selected. OE, CE, BHE and/or BHE = V
12. WE is HIGH for Read cycle.
13. Address valid prior to or coincident with CE transition LOW.
Read Cycle No. 2 (OE Controlled)
Read Cycle No. 1
DATA OUT
CURRENT
DATA OUT
ADDRESS
BHE, BLE
* CAPACITIVE LOAD CONSISTS
OF ALL COMPONENTS OF THE
TEST ENVIRONMENT
SUPPLY
ADDRESS
Thevenin load shown in Figure (b). High-Z characteristics are tested for all speeds using the test load shown in Figure (d).
V
8-, 10-ns Devices
CC
GND
3.0V
OE
Rise Time: 1 V/ns
CE
OUTPUT
[11, 12]
PREVIOUS DATA VALID
10%
HIGH IMPEDANCE
90%
Z = 50
t
t
LZCE
PU
ALL INPUT PULSES
(a)
(c)
[12, 13]
t
ACE
1.5V
50
t
t
LZBE
t
DBE
LZOE
t
DOE
[10]
50%
t
OHA
Fall Time: 1 V/ns
90%
t
30 pF*
AA
IL
10%
.
t
RC
t
RC
High-Z Characteristics
12-, 15-, 20-ns Devices
OUTPUT
DATA VALID
OUTPUT
3.3V
3.3V
30 pF
5 pF
(d)
(b)
t
HZOE
DATA VALID
R 317
R 317
t
t
HZCE
HZBE
CY7C1041CV33
t
PD
351
351
R2
R2
50%
IMPEDANCE
HIGH
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