CAT28F001 CATALYST [Catalyst Semiconductor], CAT28F001 Datasheet - Page 3

• Manufacturer Part Number: CAT28F001
• Description: 1 Megabit CMOS Boot Block Flash Memory
• Manufacturer: CATALYST [Catalyst Semiconductor]

ABSOLUTE MAXIMUM RATINGS*
Temperature Under Bias ................... –55 C to +95 C
Storage Temperature ....................... –65 C to +150 C
Voltage on Any Pin with
Voltage on Pin A
V
V
Package Power Dissipation
Lead Soldering Temperature (10 secs) ............ 300 C
Output Short Circuit Current
RELIABILITY CHARACTERISTICS
CAPACITANCE T
Note:
(1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
(2) Output shorted for no more than one second. No more than one output shorted at a time.
(3) This parameter is tested initially and after a design or process change that affects the parameter.
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to V
PP
CC
N
T
V
I
Symbol
LTH
Symbol
C
C
C
DR
voltage on output pins is V
Respect to Ground
(Except A
Respect to Ground
during Program/Erase
Capability (T
END
ZAP
with Respect to Ground
with Respect to Ground
IN
OUT
VPP
(3)
(3)(4)
(3)
(3)
(3)
(3)
(3)
9
, RP, OE, V
A
Endurance
Data Retention
ESD Susceptibility
Latch-Up
9
, RP AND OE with
= 25 C) .................................. 1.0 W
A
Input Pin Capacitance
Output Pin Capacitance
V
Parameter
= 25 C, f = 1.0 MHz
PP
(1)
(1)
Supply Capacitance
CC
........... –2.0V to +V
................... –2.0V to +13.5V
(1)
CC
+0.5V, which may overshoot to V
.............. –2.0V to +14.0V
(1)
(2)
Test
and V
............ –2.0V to +7.0V
........................ 100 mA
PP
)
100K
2000
Min.
100
10
CC
+ 2.0V
Max.
CC
+ 2.0V for periods of less than 20ns.
3
Min
*COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of
the device at these or any other conditions outside of those
listed in the operational sections of this specification is not
implied. Exposure to any absolute maximum rating for
extended periods may affect device performance and
reliability.
Limits
Cycles/Byte
Years
Units
Volts
mA
Max.
12
25
8
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
JEDEC Standard 17
CC
Units
pF
pF
pF
+1V.
Test Method
Doc. No. 25071-00 2/98 F-1
Conditions
V
V
V
IN
OUT
PP
CAT28F001
= 0V
= 0V
= 0V