HCF4013 STMICROELECTRONICS [STMicroelectronics], HCF4013 Datasheet - Page 5

• Manufacturer Part Number: HCF4013
• Description: NAND GATES
• Manufacturer: STMICROELECTRONICS [STMicroelectronics]

TEST CIRCUITS
Quiescent Device Current.
Input Leakage Current.
DYNAMIC ELECTRICAL CHARACTERISTICS (T
typical temperature coefficient for all V
t
t
Symbol
PL H
THL
, t
, t
P HL
T L H
Propagation Delay Time
Transition Time
Parameter
D D
values is 0.3%/ C, all input rise and fall times = 20ns)
Test Conditions
amb
Noise Immunity.
= 25 C, C
V
L
D D
10
15
10
15
= 50pF, R
5
5
(V) Min.
HCC/HCF4011B/12B/23B
L
= 200k ,
Value
Typ.
125
100
60
45
50
40
Max.
250
120
200
100
90
80
Unit
ns
ns
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