MAX5195EGM MAXIM [Maxim Integrated Products], MAX5195EGM Datasheet - Page 16

• Manufacturer Part Number: MAX5195EGM
• Description: 14-Bit, 260Msps High-Dynamic Performance DAC
• Manufacturer: MAXIM [Maxim Integrated Products]

The offset error is the difference between the ideal and
the actual offset point. For a DAC, the offset point is the
step value when the digital input is at midscale. This
error affects all codes by the same amount.
A gain error is the difference between the ideal and the
actual full-scale output voltage on the transfer curve,
after nullifying the offset error. This error alters the slope
of the transfer function and corresponds to the same
percentage error in each step.
Glitch impulses are caused by asymmetrical switching
times in the DAC architecture, which generates unde-
sired output transients. The amount of energy that
appears at DAC’s output is measured over time and is
usually specified in the pV-s range.
For a waveform perfectly reconstructed from digital
samples, the theoretical maximum SNR is the ratio of the
full-scale analog output (RMS value) to the RMS quanti-
zation error (residual error). The ideal, theoretical mini-
mum can be derived from the DAC’s resolution (N bits):
However, noise sources such as thermal noise, refer-
ence noise, clock jitter, etc., affect the ideal reading.
SNR is therefore computed by taking the ratio of the
RMS signal to the RMS noise, which includes all spec-
tral components minus the fundamental, the first four
harmonics, and the DC offset.
14-Bit, 260Msps High-Dynamic
Performance DAC
16
______________________________________________________________________________________
Dynamic Performance Parameter
SNR
dB
= 6.02
Signal-to-Noise Ratio (SNR)
dB
✕
N + 1.76
dB
Glitch Energy
Definitions
Offset Error
Gain Error
SFDR is the ratio of RMS amplitude of the carrier fre-
quency (maximum signal components) to the RMS
value of the next largest distortion component. SFDR is
measured in dBc, with respect to the carrier frequency
amplitude.
A series of equally spaced ones is applied to the DAC
with one tone removed from the center of the range.
MTPR is defined as the worst-case distortion (usually a
3rd-order harmonic product of the fundamental frequen-
cies), which appears as the largest spur at the frequency
of the missing tone in the sequence. This test can be
performed with any number of input tones; however, four
and eight tones are among the most common test condi-
tions for CDMA- and GSM/EDGE-type applications.
The two-tone IMD is the ratio expressed in dBc of either
input tone to the worst 3rd-order (or higher) IMD prod-
ucts. Note that 2nd-order IMD products usually fall at
frequencies, which can be easily removed by digital fil-
tering. Therefore, they are not as critical as 3rd-order
IMDs. The two-tone IMD performance of the MAX5195
was tested with the two individual input tone levels set
to -9dBFS and -12dBFS.
TRANSISTOR COUNT: 15,000
PROCESS: SiGe
Intermodulation Distortion (IMD)
Spurious-Free Dynamic Range
Multitone Power Ratio (MTPR)
Chip Information