HCS20HMSR INTERSIL [Intersil Corporation], HCS20HMSR Datasheet - Page 4

• Manufacturer Part Number: HCS20HMSR
• Description: Radiation Hardened Dual 4-Input NAND Gate
• Manufacturer: INTERSIL [Intersil Corporation]

NOTES:
NOTE: 1. Alternate Group A testing in accordance with Method 5005 of MIL-STD-883 may be exercised.
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500 , CL = 50pF, Input TR = TF = 3ns, VIL = GND, VIH = VCC.
3. For functional tests, VO
Noise Immunity
Functional Test
Input to Yn
Initial Test (Preburn-In)
Interim Test I (Postburn-In)
Interim Test II (Postburn-In)
PDA
Interim Test III (Postburn-In)
PDA
Final Test
Group A (Note 1)
Group B
Group D
PARAMETER
CONFORMANCE GROUPS
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25
ICC
IOL/IOH
Subgroup B-5
Subgroup B-6
SYMBOL
4.0V is recognized as a logic “1”, and VO
TPHL
TPLH
FN
PARAMETER
VCC = 4.5V, VIH = 0.70(VCC),
VIL = 0.30(VCC), (Note 3)
VCC = 4.5V
VCC = 4.5V
TABLE 6. APPLICABLE SUBGROUPS
Specifications HCS20MS
Sample/5005
Sample/5005
Sample/5005
Sample/5005
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
METHOD
CONDITIONS
(NOTES 1, 2)
SUBGROUP
GROUP B
5
5
46
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
1, 2, 3, 7, 8A, 8B, 9, 10, 11
GROUP A SUBGROUPS
0.5V is recognized as a logic “0”.
2, 3, 8A, 8B, 10, 11
1, 7, 9, Deltas
1, 7, 9, Deltas
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
-15% of 0 Hour
DELTA LIMIT
TEMPERATURE
3 A
+25
+25
+25
o
o
o
C
C
C
ICC, IOL/H
ICC, IOL/H
ICC, IOL/H
ICC, IOL/H
Subgroups 1, 2, 3, 9, 10, 11
o
C)
READ AND RECORD
MIN
4.0
2
2
Spec Number
200K RAD
LIMITS
MAX
0.5
20
22
UNITS
518761
ns
ns
V