HCTS132DMSR INTERSIL [Intersil Corporation], HCTS132DMSR Datasheet - Page 5
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HCTS132DMSR
Manufacturer Part Number
HCTS132DMSR
Description
Radiation Hardened Quad 2-Input NAND Schmitt Trigger
Manufacturer
INTERSIL [Intersil Corporation]
Datasheet
1.HCTS132DMSR.pdf
(9 pages)
NOTE: Except FN test which will be performed 100% Go/No-Go.
NOTES:
1. Each pin except VCC and GND will have a resistor of 10K
2. Each pin except VCC and GND will have a resistor of 1K
Group E Subgroup 2
STATIC BURN-IN I TEST CONDITIONS (Note 1)
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
DYNAMIC BURN-IN I TEST CONNECTIONS (Note 2)
CONFORMANCE
3, 6, 8, 11
3, 6, 8, 11
OPEN
GROUPS
-
NOTE: Each pin except VCC and GND will have a resistor of 47K
1, 2, 4, 5, 7, 9, 10, 12,
3, 6, 8, 11
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
OPEN
GROUND
METHOD
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
13
5005
7
7
TABLE 9. IRRADIATION TEST CONNECTIONS
Specifications HCTS132MS
TABLE 7. TOTAL DOSE IRRADIATION
1/2 VCC = 3V 0.5V
PRE RAD
1, 7, 9
GROUND
3, 6, 8, 11
7
-
-
5% for dynamic burn-in.
5% for static burn-in.
504
TEST
POST RAD
1, 2, 4, 5, 9, 10, 12,
VCC = 6V
Table 4
13, 14
1, 2, 4, 5, 9, 10, 12, 13, 14
14
14
VCC = 5V
0.5V
5% for irradiation testing.
PRE RAD
1, 2, 4, 5, 9, 10,
0.5V
1, 9
READ AND RECORD
50kHz
12, 13
-
-
OSCILLATOR
Spec Number
Table 4 (Note 1)
POST RAD
25kHz
-
-
-
518604