K6R1004C1A SAMSUNG [Samsung semiconductor], K6R1004C1A Datasheet - Page 6
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K6R1004C1A
Manufacturer Part Number
K6R1004C1A
Description
256Kx4 High Speed Static RAM(5V Operating), Revolutionary Pin out
Manufacturer
SAMSUNG [Samsung semiconductor]
Datasheet
1.K6R1004C1A.pdf
(8 pages)
K6R1004C1A-C
TIMING WAVEFORM OF WRITE CYCLE(2)
TIMING WAVEFORM OF WRITE CYCLE(1)
Address
CS
WE
Data in
Data out
Address
CS
WE
Data in
Data out
OE
NOTES(READ CYCLE)
1. WE is high for read cycle.
2. All read cycle timing is referenced from the last valid address to the first transition address.
3. t
4. At any given temperature and voltage condition, t
5. Transition is measured 200mV from steady state voltage with Load(B). This parameter is sampled and not 100% tested.
6. Device is continuously selected with CS=V
7. Address valid prior to coincident with CS transition low.
8. For common I/O applications, minimization or elimination of bus contention conditions is necessary during read and write
V
device.
cycle.
HZ
OL
and t
levels.
OHZ
are defined as the time at which the outputs achieve the open circuit condition and are not referenced to V
High-Z
High-Z
t
t
AS(4)
AS(4)
(OE=Low Fixed)
(OE= Clock)
IL.
t
OHZ(6)
- 6 -
HZ
t
(Max.) is less than t
WHZ(6)
t
t
AW
AW
t
t
CW(3)
CW(3)
t
t
WC
WC
t
t
WP1(2)
WP(2)
High-Z(8)
High-Z(8)
LZ
Valid Data
Valid Data
(Min.) both for a given device and from device to
t
t
DW
DW
t
t
t
t
WR(5)
WR(5)
DH
DH
t
OW
CMOS SRAM
PRELIMINARY
(10)
February 1998
Rev 4.0
(9)
OH
or