LCMXO2-2000HE-4TG144C Lattice, LCMXO2-2000HE-4TG144C Datasheet - Page 26
LCMXO2-2000HE-4TG144C
Manufacturer Part Number
LCMXO2-2000HE-4TG144C
Description
FPGA - Field Programmable Gate Array 2112 LUTs 112 IO 3.3V 4 Spd
Manufacturer
Lattice
Datasheet
1.LCMXO2280E-4BN256C.pdf
(30 pages)
Specifications of LCMXO2-2000HE-4TG144C
Rohs
yes
Number Of Gates
2 K
Embedded Block Ram - Ebr
74 Kbit
Number Of I/os
112
Maximum Operating Frequency
269 MHz
Operating Supply Voltage
1.14 V to 1.26 V, 1.14 V to 3.465 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Package / Case
TQFP-144
Distributed Ram
16 Kbit
Minimum Operating Temperature
0 C
Operating Supply Current
4.8 mA
Factory Pack Quantity
60
User Flash Memory - Ufm
80 Kbit
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
LCMXO2-2000HE-4TG144C
Manufacturer:
Lattice Semiconductor Corporation
Quantity:
10 000
4.5 MachXO2 Product Family High Temperature Storage Life (HTSL)
High Temperature Storage Life (HTSL)
The High Temperature Storage Life test is used to determine the effect of time and temperature, under storage
conditions, for thermally activated failure mechanisms. Consistent with JEDEC JESD22-A103C, the devices are
subjected to high temperature storage Condition B: +150 (-0/+10) °C for 1000 hours. Prior to High Temperature
Storage, all MachXO2 devices are subjected to Surface Mount Preconditioning as mentioned in Table 4.1.1.
This is a relatively new requirement consistent with JESD47F for Pb-free, wirebonded packages.
MSL3 Packages: TQFP, csBGA, QFN
Stress Duration: 168, 500, 1000, 1500 hours.
Temperature: 150°C (ambient)
Method: Lattice Document # 87-101925 and JESD22-A103C / JESD22-A117A
Table 4.5.1: MachXO2 High Temperature Storage Life Results
* 1 unit failed for “opens” due to handling damage.
** 1 unit failed for “opens” due to handling damage.
INDEX Return
Sample size reduced by one.
Sample size reduced by one.
Product Name
LCMXO2-1200
LCMXO2-1200
LCMXO2-1200
LCMXO2-1200
LCMXO2-1200
LCMXO2-1200
LCMXO2-7000
LCMXO2-7000
LCMXO2-7000
LXMXO2-4000
LXMXO2-4000
LXMXO2-4000
LCMXO2-256
LCMXO2-256
LCMXO2-256
LCMXO2-256
LCMXO2-256
132csBGA
132csBGA
132csBGA
184csBGA
184csBGA
184csBGA
484fpBGA
484fpBGA
484fpBGA
144TQFP
144TQFP
144TQFP
64ucBGA
64ucBGA
Package
32QFN
32QFN
32QFN
ASEKH
ASEKH
ASEKH
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
Lot #
Lot Number Quantity
Lot #1
Lot #2
Lot #3
Lot #1
Lot #2
Lot #1
Lot #2
Lot #3
Lot #1
Lot #2
Lot #3
Lot #1
Lot #2
Lot #3
Lot #1
Lot #2
Lot #3
81**
76*
82
82
77
80
77
77
77
80
80
80
77
77
77
77
77
26
Fails
# of
MachXO2 Cumulative HTSL failure Rate = 0 / 1,334
MachXO2 Cumulative HTSL device hours = 1,643,000
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
500 Hrs
Result
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Lattice Semiconductor Corporation Doc. #25-106923 Rev. F
1000 Hrs
Result
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1500 Hrs
Result
N/A
N/A
N/A
N/A
N/A
N/A
0
0
0
0
0
0
0
0
0
0
0
Cumulative
115,500
120,000
115,500
115,500
115,500
114,000
115,500
115,500
81,000
82,000
82,000
77,000
80,000
80,000
80,000
77,000
77,000
Hours