74LVQ280MTR STMicroelectronics, 74LVQ280MTR Datasheet - Page 4
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74LVQ280MTR
Manufacturer Part Number
74LVQ280MTR
Description
Parity Functions 9-Bit Parity Gen
Manufacturer
STMicroelectronics
Datasheet
1.74LVQ280MTR.pdf
(11 pages)
Specifications of 74LVQ280MTR
Product Category
Parity Functions
Rohs
yes
Number Of Circuits
1
Number Of Bits
9
Logic Family
74LVQ
Package / Case
SO-14
High Level Output Current
- 24 mA
Low Level Output Current
24 mA
Propagation Delay Time
16 ns, 11.5 ns
Operating Supply Voltage
2 V to 3.6 V
Maximum Operating Temperature
+ 125 C
Minimum Operating Temperature
- 55 C
Mounting Style
SMD/SMT
Factory Pack Quantity
2500
Supply Voltage - Max
3.6 V
Supply Voltage - Min
2 V
74LVQ280
Table 7: Dynamic Switching Characteristics
1) Worst case package.
2) Max number of outputs defined as (n). Data inputs are driven 0V to 3.3V, (n-1) outputs switching and one output at GND.
3) Max number of data inputs (n) switching. (n-1) switching 0V to 3.3V. Inputs under test switching: 3.3V to threshold (V
(V
Table 8: AC Electrical Characteristics (C
1) Skew is defined as the absolute value of the difference between the actual propagation delay for any two outputs of the same device switch-
ing in the same direction, either HIGH or LOW (t
2) Parameter guaranteed by design
(*) Voltage range is 3.3V
Table 9: Capacitive Characteristics
1) C
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. I
4/11
t
Symbol
Symbol
Symbol
PLH
IHD
t
t
V
V
V
V
OSLH
OSHL
C
PD
C
OLP
OLV
IHD
), f=1MHz.
ILD
PD
IN
t
is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
PHL
Dynamic Low
Voltage Quiet
Output (note 1, 2)
Dynamic High
Voltage Input
(note 1, 3)
Dynamic Low
Voltage Input
(note 1, 3)
Propagation Delay
Time
Output To Output
Skew Time
(note1, 2)
Input Capacitance
Power Dissipation
Capacitance
(note 1)
Parameter
Parameter
Parameter
0.3V
3.3
3.3
V
V
V
3.3
3.3
3.3
2.7
2.7
3.3
3.3
(V)
(V)
(V)
CC
CC
CC
(*)
(*)
Test Condition
Test Condition
Test Condition
OSLH
f
C
IN
L
= |t
= 10MHz
= 50 pF
PLHm
L
= 50 pF, R
- t
PLHn
|, t
OSHL
Min.
Min.
Min.
-0.8
L
2
= 500
= |t
T
T
T
A
A
A
PHLm
Typ.
Typ.
Typ.
= 25°C
-0.3
= 25°C
= 25°C
0.3
9.9
8.0
0.5
0.5
59
4
- t
, Input t
PHLn
Max.
Max.
Max.
16.0
11.5
0.8
0.8
1.0
1.0
|)
CC(opr)
r
Value
Value
Value
Min.
Min.
Min.
-40 to 85°C
-40 to 85°C
-40 to 85°C
= t
f
= C
= 3ns)
Max.
Max.
Max.
19.0
13.5
PD
1.0
1.0
x V
CC
-55 to 125°C
-55 to 125°C
-55 to 125°C
Min.
Min.
Min.
x f
IN
ILD
+ I
), 0V to threshold
CC
Max.
Max.
Max.
22.0
16.0
1.0
1.0
/n (per circuit)
Unit
Unit
Unit
pF
pF
ns
ns
V
V
V