IS43R16160B-5TLI ISSI, Integrated Silicon Solution Inc, IS43R16160B-5TLI Datasheet - Page 22

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IS43R16160B-5TLI

Manufacturer Part Number
IS43R16160B-5TLI
Description
IC DDR SDRAM 256MBIT 66TSOP
Manufacturer
ISSI, Integrated Silicon Solution Inc
Type
SDRAMr
Datasheets

Specifications of IS43R16160B-5TLI

Format - Memory
RAM
Memory Type
DDR SDRAM
Memory Size
256M (16Mx16)
Speed
200MHz
Interface
Parallel
Voltage - Supply
2.5 V ~ 2.7 V
Operating Temperature
-40°C ~ 85°C
Package / Case
66-TSOPII
Organization
16Mx16
Density
256Mb
Address Bus
15b
Access Time (max)
700ps
Maximum Clock Rate
200MHz
Operating Supply Voltage (typ)
2.5V
Package Type
TSOP-II
Operating Temp Range
-40C to 85C
Operating Supply Voltage (max)
2.7V
Operating Supply Voltage (min)
2.3V
Pin Count
66
Mounting
Surface Mount
Operating Temperature Classification
Industrial
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

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Company
Part Number
Manufacturer
Quantity
Price
Part Number:
IS43R16160B-5TLI
Manufacturer:
TI
Quantity:
157
Part Number:
IS43R16160B-5TLI
Manufacturer:
ISSI
Quantity:
20 000
IS43R83200B
IS43R16160B, IC43R16160B
22
DDR SDRAM (Rev.1.1)
I
I
Notes
1. All voltages referenced to Vss.
2. Tests for AC timing, IDD, and electrical, AC and DC characteristics, may be conducted at nominal reference/supply
voltage levels, but the related specifications and device operation are guaranteed for the full voltage range specified.
3. AC timing and IDD tests may use a VIL to VIH swing of up to 1.5V in the test environment, but input timing is still
referenced to VREF (or to the crossing point for CK//CK), and parameter specifications are guaranteed for the
specified AC input levels under normal use conditions. The minimum slew rate for the input signals is 1V/ns in the
range between VIL(AC) and VIH(AC).
4. The AC and DC input level specifications are as defined in the SSTL_2 Standard (i.e. the receiver will effectively
switch as a result of the signal crossing the AC input level, and will remain in that state as long as the signal does not
ring back above (below) the DC input LOW (HIGH) level.
5. VREF is expected to be equal to 0.5*VddQ of the transmitting device, and to track variations in the DC level of the
same. Peak-to-peak noise on VREF may not exceed +2% of the DC value.
6. VTT is not applied directly to the device. VTT is a system supply for signal termination resistors, is expected to be
set equal to VREF, and must track variations in the DC level of VREF.
7. VID is the magnitude of the difference between the input level on CLK and the input level on /CLK.
8. The value of VIX is expected to equal 0.5*VddQ of the transmitting device and must track variations in the DC level
of the same.
9. Enables on-chip refresh and address counters.
10. IDD specifications are tested after the device is properly initialized.
11. This parameter is sampled. VddQ = 2.5V+0.2V, Vdd = 2.5V + 0.2V , f = 100 MHz, Ta = 25
VddQ/2, VOUT(PEAK TO PEAK) = 25mV. DM inputs are grouped with I/O pins - reflecting the fact that they are
matched in loading (to facilitate trace matching at the board level).
12. The CLK//CLK input reference level (for timing referenced to CLK//CLK) is the point at which CLK and /CLK
cross; the input reference level for signals other than CLK//CLK, is VREF.
13. Inputs are not recognized as valid until VREF stabilizes. Exception: during the period before VREF stabilizes,
CKE< 0.3VddQ is recognized as LOW.
14. t HZ and tLZ transitions occur in the same access time windows as valid data transitions. These parameters are not
referenced to a specific voltage level, but specify when the device output is no longer driving (HZ), or begins driving
(LZ).
15. The maximum limit for this parameter is not a device limit. The device will operate with a greater value for this
parameter, but system performance (bus turnaround) will degrade accordingly.
16. The specific requirement is that DQS be valid (HIGH, LOW, or at some point on a valid transition) on or before
this CLK edge. A valid transition is defined as monotonic, and meeting the input slew rate specifications of the device.
When no writes were previously in progress on the bus, DQS will be transitioning from High-Z to logic LOW. If a
previous write was in progress, DQS could be HIGH, LOW, or transitioning from HIGH to LOW at this time,
depending on tDQSS.
17. A maximum of eight AUTO REFRESH commands can be posted to any given DDR SDRAM device.
18. tXPRD should be 200 tCLK in the condition of the unstable CLK operation during the power down mode.
19. For command/address and CK & /CK slew rate > 1.0V/ns.
20. Min (tCL,tCH) refers to the smaller of the actual clock low time and the actual clock high time as provided to the
device.
Timing patterns:
*100% of data changing at every burst
tCK=min,tRRD=2*tCK,BL=4,tRCD=3*tCK,Read with Autoprecharge
Read:A0 N A1 R0 A2 R1 N R3 A0 N A1 R0 – repeat the same timing with random address changing
Legend: A=Activate,R=Read,P=Precharge,N=NOP
Preliminary
Preliminary
256M Double Data Rate Synchronous DRAM
Zentel Electronics Corporation
A3S56D30/40ETP
Integrated Silicon Solution, Inc.
o
C, VOUT(DC) =
10/31/08
Rev. B

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