AT28LV010-20JI Atmel, AT28LV010-20JI Datasheet - Page 2

• Manufacturer Part Number: AT28LV010-20JI
• Description: IC EEPROM 1MBIT 200NS 32PLCC
• Manufacturer: Atmel

Specifications of AT28LV010-20JI

• Format - Memory: EEPROMs - Parallel
• Memory Type: EEPROM
• Memory Size: 1M (128K x 8)
• Speed: 200ns
• Interface: Parallel
• Voltage - Supply: 3 V ~ 3.6 V
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 32-PLCC
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant

The AT28LV010 is accessed like a Static RAM for the read
or write cycle without the need for external components.
The device contains a 128-byte page register to allow writ-
ing of up to 128 bytes simultaneously. During a write cycle,
the address and 1 to 128 bytes of data are internally
latched, freeing the address and data bus for other opera-
tions. Following the initiation of a write cycle, the device will
automatically write the latched data using an internal con-
trol timer. The end of a write cycle can be detected by
Block Diagram
Absolute Maximum Ratings*
2
Temperature Under Bias ................................ -55°C to +125°C
Storage Temperature ..................................... -65°C to +150°C
All Input Voltages (including NC Pins)
with Respect to Ground ...................................-0.6V to +6.25V
All Output Voltages
with Respect to Ground .............................-0.6V to V
Voltage on OE and A9
with Respect to Ground ...................................-0.6V to +13.5V
AT28LV010
CC
+ 0.6V
DATA polling of I/O7. Once the end of a write cycle has
been detected a new access for a read or write can begin.
Atmel’s 28LV010 has additional features to ensure high
quality and manufacturability. The device utilizes internal
error correction for extended endurance and improved data
retention characteristics. Software data protection is imple-
mented to guard against inadvertent writes. The device
also includes an extra 128 bytes of EEPROM for device
identification or tracking.
*NOTICE:
Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam-
age to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reliability