AS1113-BQFT austriamicrosystems, AS1113-BQFT Datasheet - Page 15

• Manufacturer Part Number: AS1113-BQFT
• Description: IC DRIVER LED 16-CHAN 28-TQFN
• Manufacturer: austriamicrosystems
• Type: General Purposer

Specifications of AS1113-BQFT

• Constant Current: Yes
• Topology: 16-Bit Shift Register, PWM
• Number Of Outputs: 16
• Internal Driver: Yes
• Type - Primary: General Purpose
• Frequency: 50MHz
• Voltage - Supply: 3 V ~ 5.5 V
• Voltage - Output: 15V
• Mounting Type: Surface Mount
• Package / Case: 28-WQFN
• Operating Temperature: -40°C ~ 85°C
• Current - Output / Channel: 50mA
• Internal Switch(s): Yes
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Efficiency: -

AS1113
Datasheet - D e t a i l e d D e s c r i p t i o n
Detailed Shorted-LED Error Report
The detailed shorted-LED error report can be read out immediately after global error mode has been run
Error Mode on page
Figure 15. Detailed Shorted-LED Error Report Timing Diagram
Detailed Shorted-LED Error Report Example
Consider a case where three AS1113s are cascaded in one chain. A 1 indicates a LED is on, a 0 indicates a LED is off,
and an X indicates a shorted LED. This test is used on-the-fly.
IC1 has two shorted LEDs which are switched on, IC3 has one shorted LED switched off due to input. 3*16 clock
cycles are needed to write the entire error code out. The detailed error report would look like this:
Showing IC1 as the device with two shorted LEDs at position 6 and 7, and IC3 with one shorted LED at position 1. The
shorted LED at position 1 of IC3 cannot be detected, since LEDs turned off at test time are not tested and will show a
logic "1" at the detailed error report. To test all LEDs this test should be run with an all 1s test pattern. For a test with an
all on test pattern, low-current diagnostic mode should be entered first to reduce on-screen flickering.
Note: In an actual report there are no spaces in the output. LEDs turned off during test time cannot be tested and will
Low-Current Diagnostic Mode
To run the open- or shorted-LED test, a test pattern must be used that will turn on each LED to be tested. This test pat-
tern will cause a short flicker on the screen while the test is being performed. The low-current diagnostic mode can be
initiated prior to running a detailed error report to reduce this on-screen flickering.
Note: Normally, displays using such a diagnostic mode require additional cables, resistors, and other components to
Low-current diagnostic mode can be initiated via 3 clock pulses during error-detection mode. After the falling edge of
LD, a test pattern displaying all 1s can be written to the shift register which will be used for the next error-detection test.
www.austriamicrosystems.com/LED-Driver-ICs/AS1113
For detailed timing information see
SDO
OEN
CLK
SDI
LD
Failure Code: 1 1 1 1 1 0 0 1 1 1 1 1 1 1 1 1
LED Status: 1 1 1 1 1 X X 1 1 1 1 1 1 1 1 1
Input Data: 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1
show a logic 1 in the detailed error report.
reduce the current. The AS1113 has this current-reduction capability built-in, thereby minimizing the number of
external components required.
t
GSW(ERROR)
t
TESTING
T
T
11). SDI must be 1 for the first device.
FLAG
FLAG
t
t
Global Flag Readout
Global Flag Readout
SU(ERROR)
GSW(ERROR)
IC1:[11111XX111111111] IC2:[1111111111111111] IC3:[X100011111111111]
t
P4
O
FLAG
Timing Diagrams on page
t
SW(ERROR)
t
GSW(ERROR)
S
FLAG
t
t
P4
9.
H(L)
DBit15
1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1
1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1
1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1
SBit15
Revision 1.04
DBit14 DBit13 DBit12
Shorted-LED Error Report Output
Detailed Error Report Readout
SBit14 SBit13 SBit12
New Data Input
DBitn
SBitn
DBit2
SBit2
0 1 0 0 0 1 1 1 1 1 1 1 1 1 1 1
X 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1
1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1
DBit1
SBit1
DBit0
SBit0
t
P1
Don’t
Don’t
Care
Care
(see Global
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