AS1113-BQFT austriamicrosystems, AS1113-BQFT Datasheet - Page 18

• Manufacturer Part Number: AS1113-BQFT
• Description: IC DRIVER LED 16-CHAN 28-TQFN
• Manufacturer: austriamicrosystems
• Type: General Purposer

Specifications of AS1113-BQFT

• Constant Current: Yes
• Topology: 16-Bit Shift Register, PWM
• Number Of Outputs: 16
• Internal Driver: Yes
• Type - Primary: General Purpose
• Frequency: 50MHz
• Voltage - Supply: 3 V ~ 5.5 V
• Voltage - Output: 15V
• Mounting Type: Surface Mount
• Package / Case: 28-WQFN
• Operating Temperature: -40°C ~ 85°C
• Current - Output / Channel: 50mA
• Internal Switch(s): Yes
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Efficiency: -

AS1113
Datasheet - A p p l i c a t i o n I n f o r m a t i o n
The last pattern written into the shift register will be saved before starting low-current diagnosis mode and can be dis-
played immediately after the test has been performed.
Low-current diagnostic mode is started with 3 clock pulses during error detection mode. Then OEN should be enabled
for ≥2µs for testing. With the rising edge of OEN the LED test is stopped, and while LD is high the desired error mode
can be selected with the corresponding clock pulses. After LD and OEN go low again the previously saved pattern can
be displayed at the outputs.
With the next data input the detailed error code will be clocked out at pin SDO.
Note: See
Figure 20. Low-Current Diagnosis Mode with External Test Pattern – 64 Cascaded AS1113s
Cascading Devices
To cascade multiple AS1113 devices, pin SDO must be connected to pin SDI of the next AS1113
each rising edge of CLK the LSB of the shift register will be written into the shift register SDI of the next AS1113 in the
chain.
Note: When n*AS1113 devices are in one chain, n*16 clock pulses are needed to latch-in the input data.
Figure 21. Cascading AS1113 Devices
www.austriamicrosystems.com/LED-Driver-ICs/AS1113
Display
OEN
Current
CLK
LD
SDO
OEN
CLK
SDI
SDI
LD
Figure 20
External all 1s Test Pattern
SDI
T/O or S Error Code
Data1
1024x
Data0
for use of an external test pattern.
AS1113 #1
CLK
≤ 50mA
LD
Low-Current
3x Clocks
OEN
Mode
SDO
≤ 0.8mA
SDI
Clock for Error
Mode 1x/2x
Rising Edge of OEN
Acquisition of Error Status
GEF
Low-Current Diagnosis Mode
AS1113 #2
CLK
Falling Edge of LD; Error Register
is copied into Shift Register
Revision 1.04
LD
O or S Error Code
from Test Pattern
Data2
1024x
OEN
SDO
≤ 50mA
GEF
SDI
GEF = Global Error Flag
AS1113 #n-1
CLK
Temperature Error Code
(see Figure
LD
Data2
1024x
Data3
OEN
SDO
21). At
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