HCPL-316J Avago Technologies US Inc., HCPL-316J Datasheet - Page 15
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HCPL-316J
Manufacturer Part Number
HCPL-316J
Description
OPTOCOUPLER GATE DRV 2A 16-SOIC
Manufacturer
Avago Technologies US Inc.
Datasheet
1.HCPL-316J-500E.pdf
(33 pages)
Specifications of HCPL-316J
Configuration
High-Side
Input Type
Differential
Delay Time
300ns
Current - Peak
2.5A
Number Of Configurations
1
Number Of Outputs
1
Voltage - Supply
4.5 V ~ 5.5 V
Operating Temperature
-40°C ~ 100°C
Mounting Type
Surface Mount
Package / Case
16-SOIC (0.300", 7.5mm Width)
No. Of Channels
1
Isolation Voltage
3.75kV
Optocoupler Output Type
Gate Drive
Input Current
22mA
Output Voltage
30V
Opto Case Style
SOIC
No. Of Pins
16
Propagation Delay Low-high
0.5µs
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
High Side Voltage - Max (bootstrap)
-
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant, Contains lead / RoHS non-compliant
Other names
516-1130-5
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
HCPL-316J
Manufacturer:
AVAGO
Quantity:
20 700
Company:
Part Number:
HCPL-316J
Manufacturer:
AD
Quantity:
1 939
Part Number:
HCPL-316J
Manufacturer:
AGILENT
Quantity:
20 000
Company:
Part Number:
HCPL-316J#500
Manufacturer:
AGILENT
Quantity:
3 169
Part Number:
HCPL-316J#500
Manufacturer:
AGILENT
Quantity:
20 000
Company:
Part Number:
HCPL-316J-000E
Manufacturer:
KOITECH
Quantity:
713
Company:
Part Number:
HCPL-316J-000E
Manufacturer:
AVAGO
Quantity:
21 000
Part Number:
HCPL-316J-000E
Manufacturer:
AVAGO/安华高
Quantity:
20 000
Part Number:
HCPL-316J-500E
Manufacturer:
AVAGO/安华高
Quantity:
20 000
Part Number:
HCPL-316J-500E/HCPL316J-500E
Manufacturer:
AVAGO/安华高
Quantity:
20 000
5 V
Figure 34. I
Test Circuit Diagrams
Figure 30. I
5 V
Figure 32. I
15
4.5 V
0.4 V
+
–
+
–
+
–
–
+
I
0.1
0.1
μF
FAULT
μF
OLF
FAULTL
OH
0.1
μF
pulsed test circuit.
test circuit.
test circuit.
V
V
V
GND1
RESET
FAULT
V
V
V
V
V
GND1
RESET
FAULT
V
V
IN+
IN-
CC1
LED1+
LED1-
IN+
IN-
CC1
LED1+
LED1-
V
V
V
GND1
RESET
FAULT
V
V
IN+
IN-
CC1
LED1+
LED1-
V
V
DESAT
DESAT
LED2+
LED2+
V
V
V
V
OUT
OUT
CC2
V
V
CC2
V
V
V
V
V
V
EE
EE
EE
EE
V
C
C
E
E
DESAT
LED2+
V
V
OUT
V
V
CC2
PULSED
V
V
EE
EE
I
E
C
OUT
14 V
15 V
I
OUT
0.1 μF
0.1 μF
0.1 μF
+
–
+
–
0.1 μF
0.1
μF
–
+
+
–
30 V
30 V
10 mA
–
+
+
–
30 V
30 V
0.1 μF
0.1 μF
Figure 31. I
Figure 33. I
Figure 35. V
5 V
V
V
V
GND1
RESET
FAULT
V
V
IN+
IN-
CC1
LED1+
LED1-
5 V
+
–
FAULTH
OL
OH
0.1
μF
+
–
–
+
pulsed test circuit.
I
FAULT
pulsed test circuit.
5 V
test circuit.
0.1
μF
V
V
V
GND1
RESET
FAULT
V
V
V
DESAT
IN+
IN-
CC1
LED1+
LED1-
LED2+
V
V
OUT
V
V
CC2
V
V
EE
EE
C
E
V
V
V
GND1
RESET
FAULT
V
V
IN+
IN-
CC1
LED1+
LED1-
PULSED
15 V
I
OUT
0.1 μF
0.1 μF
V
DESAT
LED2+
+
–
V
V
OUT
V
V
CC2
V
V
EE
EE
C
E
V
DESAT
–
+
+
–
LED2+
30 V
V
30 V
V
OUT
CC2
V
V
V
V
EE
EE
V
C
E
PULSED
OUT
0.1 μF
0.1 μF
2A
0.1
μF
–
+
+
–
30 V
30 V
0.1 μF