HLMP-QB00-S0000 Avago Technologies US Inc., HLMP-QB00-S0000 Datasheet - Page 2

• Manufacturer Part Number: HLMP-QB00-S0000
• Description: LED DOME INGAN BLUE STR LDS
• Manufacturer: Avago Technologies US Inc.

Specifications of HLMP-QB00-S0000

• Viewing Angle: 12°
• Color: Blue
• Millicandela Rating: 290mcd
• Current - Test: 20mA
• Wavelength - Dominant: 468nm
• Wavelength - Peak: 470nm
• Voltage - Forward (vf) Typ: 3.7V
• Lens Type: Clear
• Lens Style/size: Round, 1.78mm
• Package / Case: Axial, Flat Leads
• Size / Dimension: 2.09mm L x 2.21mm W
• Height: 2.92mm
• Mounting Type: Through Hole
• Resistance Tolerance: 468nm
• Led Size: 2.1 mm x 2.2 mm
• Illumination Color: Blue
• Operating Voltage: 3.7 V
• Wavelength: 468 nm
• Luminous Intensity: 290 mcd
• Mounting Style: SMD/SMT
• Operating Current: 20 mA
• Lens Dimensions: 1.9 mm
• Lens Shape: Dome
• Maximum Operating Temperature: + 85 C
• Minimum Operating Temperature: - 40 C
• Peak Wavelength: 470 nm
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Luminous Flux @ Current - Test: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant
• Other names: 516-1901; HLMP-QB00-S0000

Table 2. Reliability Predictions (I
Demonstrated Performance
Notes:
1. The point typical MTBF (which represents 60% confidence level) is the total device hours divided by the number of failures. In the case of
2. The 90% Confidence MTBF represents the minimum level of reliability performance which is expected from 90% of all samples. This
3. A failure is any LED which does not emit light or maximum % Iv degradation is more than 50%.
Example of Failure Rate Calculation
Assume a device operating 8 hours/day, 5 days/week. The utilization factor, given 168 hours/week is:
The point failure rate per year (8760 hours) at 25°C ambient temperature is:
Similarly, 90% confidence level failure rate per year at 25°C:
75
55
35
25
Ambient
Temperature (°C)
85
65
45
zero failures, one failure is assumed for this calculation.
confidence interval is based on the statistics of the distribution of failures. The assumed distribution of failures is exponential. This
particular distribution is commonly used in describing useful life failures. Refer to MIL-STD-690B for details on this methodology.
(8 hours/day) x (5 days/week) / (168 hours/week) = 0.25
(0.086% / 1K hours) x (0.25) x (8760 hours/year) = 0.188% per year
(0.197% / 1K hours) x (0.25) x (8760 hours/year) = 0.431% per year
109
99
89
79
69
59
Junction
Temperature (°C)
49
F
= 30 mA) for InGaN devices
Point Typical Performance in
MTBF
18,000
132,000
Time
26.000
38,000
56,000
85,000
210,000
[1]
[1]
(60% Confidence)
1.786
1.180
Failure Rate
(%/1K Hours)
5.436
3.826
2.642
0.760
0.477
Performance in Time
(90% Confidence)
11,000
16,000
MTBF
8000
24,000
37,000
57,000
91,000
[2]
12.517
1.750
1.098
Failure Rate
(%/1K Hours)
8.810
6.082
2.716
4.112
[2]