HS2556EPI61H Renesas Electronics America, HS2556EPI61H Datasheet - Page 237

• Manufacturer Part Number: HS2556EPI61H
• Description: EMULATOR BASE H8SX/2556
• Manufacturer: Renesas Electronics America

Specifications of HS2556EPI61H

• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant

13) Test Emulation RAM Trace :
A) Free Trace ..........................OK
B) Range Trace .........................OK
C) Point to Point Trace ................OK
D) Start and Stop Event Trace ..........OK
E) Trace memory overflow ...............OK
F) Time STAMP Trace (26 MHz) ...........OK
G) Time STAMP Trace (10 MHz) ...........OK
14) Test Runtime Counter :
A) Runtime Counter (26.0 MHz) ............OK
B) Runtime Counter (20.0 MHz) ............OK
C) Runtime Counter (10.0 MHz) ............OK
D) Runtime Counter (SUB:32.768kHz) .......OK
15) Test Emulation Monitor :
A) EMA23-EMA0 ..........................OK
B) ACST2-ACST0 .........................OK
C) ASEST3-ASEST0 .......................OK
D) ASEBRKACK ...........................OK
E) CNN .................................OK
F) NOCLK, NOCLK2 .......................OK
G) WINDOW...............................OK
H) SUBACT ..............................OK
I) OTHER ...............................OK
16) Test PERFM G/A :
A) Time Measurement ....................OK
B) RESERVED
C) Subroutine Count Measurement ........OK
D) Timeout Function (TIMOT Bit) ........OK
E) Timeout Function (TIMOP Bit) ........OK
17) Test Bus Monitor :
A) Register ................................OK
B) Parallel RAM ............................OK
C) SPRSEL2 .................................OK
D) RAM monitor .............................OK
18) Test Parallel Access :
A) Internal ROM Parallel Read Access(WORD) ...........OK
B) Internal ROM Parallel Write Access(WORD) ..........OK
C) Internal ROM Parallel Write Access(High Byte) .....OK
D) Internal ROM Parallel Write Access(Low Byte) ......OK
E) Internal RAM Parallel Read Access(WORD) ...........OK
F) Internal RAM Parallel Write Access(WORD) ..........OK
G) Internal RAM Parallel Write Access(High Byte) .....OK
H) Internal RAM Parallel Write Access(Low Byte) ......OK
I) Option RAM Parallel Read Access (WORD) ............Skip
J) Option RAM Parallel Write Access(WORD) ............Skip
K) Option RAM Parallel Write Access(High Byte) .......Skip
L) Option RAM Parallel Write Access(Low Byte) ........Skip
19) Test Subchip Register Read/Write :
A) H8S/2552 Register Read/Write ......................OK
B) H8S/2556 Register Read/Write ......................OK
Tests run for xh:xmin:xxs
Tests passed, emulator functioning correctly
Shows the check results
for the trace controlling
circuits in the E6000
(normal completion).
Shows the check results
for the run-time counter
in the E6000 (normal
completion).
Shows the check results
for the emulation monitor
controlling circuits in
the E6000 (normal
completion).
Shows the check results
for analysis controlling
circuits in the E6000
(normal completion).
Shows the check results
for the bus monitor
controlling circuits in
the E6000 (normal
completion).
Shows the check results
for the parallel access
controlling circuits in
the E6000 (normal
completion).
Shows the check results
for the registers in the
E6000 (normal
completion).
Shows that the E6000 is
correctly operating.
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