C8051F541-IQ Silicon Laboratories Inc, C8051F541-IQ Datasheet - Page 47

• Manufacturer Part Number: C8051F541-IQ
• Description: IC 8051 MCU 16K FLASH 32-QFP
• Manufacturer: Silicon Laboratories Inc
• Series: C8051F54xr

Specifications of C8051F541-IQ

• Program Memory Type: FLASH
• Program Memory Size: 16KB (16K x 8)
• Package / Case: 32-QFP
• Mfg Application Notes: LIN Bootloader AppNote
• Core Processor: 8051
• Core Size: 8-Bit
• Speed: 50MHz
• Connectivity: SMBus (2-Wire/I²C), SPI, UART/USART
• Peripherals: POR, PWM, Temp Sensor, WDT
• Number Of I /o: 25
• Ram Size: 1.25K x 8
• Voltage - Supply (vcc/vdd): 1.8 V ~ 5.25 V
• Data Converters: A/D 25x12b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 125°C
• Processor Series: C8051F5x
• Core: 8051
• Data Bus Width: 8 bit
• Data Ram Size: 256 B
• Maximum Clock Frequency: 50 MHz
• Number Of Programmable I/os: 25
• Operating Supply Voltage: 1.8 V to 5.25 V
• Maximum Operating Temperature: + 125 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: PK51, CA51, A51, ULINK2
• Development Tools By Supplier: C8051F540DK
• Minimum Operating Temperature: - 40 C
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• For Use With: 336-1672 - BOARD PROTOTYPE W/C8051F540336-1669 - KIT DEVELOPMENT FOR C8051F540
• Eeprom Size: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant
• Other names: 336-1674

6. Electrical Characteristics
6.1. Absolute Maximum Specifications
Table 6.1. Absolute Maximum Ratings
Ambient Temperature under Bias
Storage Temperature
Voltage on V
Voltage on V
Voltage on VDDA with Respect to GND
Voltage on V
Voltage on any Port I/O Pin or RST with Respect to
GND
Maximum Total Current through V
Maximum Output Current Sunk by RST or any Port Pin
Maximum Output Current Sourced by any Port Pin
Note: Stresses
device. This is a stress rating only and functional operation of the devices at those or any other conditions
outside of those indicated in the operation listings of this specification is not implied. Exposure to maximum
rating conditions for extended periods may affect device reliability.
REGIN
DD
IO
outside of the range of the
with Respect to GND
with Respect to GND
with Respect to GND
Parameter
REGIN
or GND
“Absolute Maximum Ratings” may cause permanent damage to the
Rev. 1.1
Conditions
–0.3
–0.3
–0.3
–0.3
–0.3
Min
–55
–65
—
—
—
Typ
—
—
—
—
—
—
—
—
—
—
C8051F54x
V
IO
Max
135
150
500
100
100
5.5
2.8
2.8
5.5
+ 0.3
Units
mA
mA
mA
°C
°C
V
V
V
V
V
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