ITG-3200 INVENSENSE, ITG-3200 Datasheet - Page 38

• Manufacturer Part Number: ITG-3200
• Description: IC, GYRO, TRI-AXIS, +/-2000 DEG/S
• Manufacturer: INVENSENSE

Specifications of ITG-3200

• No. Of Axes: 3
• Sensor Case Style: QFN
• No. Of Pins: 24
• Supply Voltage Range: 2.1V To 3.6V
• Operating Temperature Range: -40°C To +85°C
• Interface: I2C, Serial
• Interface Type: I2C, Serial
• Rohs Compliant: Yes
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

10 Reliability
10.1 Qualification Test Policy
InvenSense’s products complete a Qualification Test Plan before being released to production. The Qualification Test
Plan follows the JEDEC 47D Standards, “Stress-Test-Driven Qualification of Integrated Circuits,” with the individual
tests described below.
10.2 Qualification Test Plan
TEST
High Temperature
Operating Life (HTOL/LFR)
Steady-State Temperature
Humidity Bias Life
High Temperature Storage
Life
TEST
ESD-HBM
ESD-MM
Latch Up
Mechanical Shock
Vibration
Temperature Cycling
TEST
Board Mechanical Shock
Board T/C
(1) –
Tests are preceded by MSL3 Preconditioning in accordance with JEDEC JESD22-A113F
(1)
(1)
Method/Condition
JEDEC JESD22-A108C, Dynamic, 3.63V biased, Tj>125°C
[read-points 168, 500, 1000 hours]
JEDEC JESD22-A101C, 85°C/85%RH
[read-points 168, 500 hours], Information Only 1000 hours]
JEDEC JESD22-A103C, Cond. A, 125°C Non-Bias Bake
[read-points 168, 500, 1000 hours]
Method/Condition
JEDEC JESD22-A114F, Class 2 (1.5KV)
JEDEC JESD22-A115-A, Class B (200V)
JEDEC JESD78B Level 2, 125C, +/- 100mA
JEDEC JESD22-B104C, Mil-Std-883, method 2002, Cond. D,
10,000g’s, 0.3ms, ±X,Y,Z – 6 directions, 5 times/direction
JEDEC JESD22-B103B, Variable Frequency (random),
Cond. B, 5-500Hz, X,Y,Z – 4 times/direction
JEDEC JESD22-A104D Condition N, -40°C to +85°C,
Soak Mode 2, 100 cycles
Method/Condition/
JEDEC JESD22-B104C,Mil-Std-883, method 2002, Cond. D,
10,000g’s, 0.3ms, +-X,Y,Z – 6 directions, 5 times/direction
JEDEC JESD22-A104D Condition N, -40°C to +85°C,
Soak Mode 2, 100 cycles
ITG-3200 Product Specification
Device Component Level Tests
Accelerated Life Tests
Board Level Tests
Document Number: PS-ITG-3200A-00-01.4
Revision: 1.4
Release Date: 03/30/2010
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