AD7789BRM Analog Devices Inc, AD7789BRM Datasheet - Page 8

• Manufacturer Part Number: AD7789BRM
• Description: Low Power 24-Bit SD ADC I.C.
• Manufacturer: Analog Devices Inc

Specifications of AD7789BRM

• Rohs Status: RoHS non-compliant
• Number Of Bits: 24
• Sampling Rate (per Second): 16.6
• Data Interface: DSP, MICROWIRE™, QSPI™, Serial, SPI™
• Number Of Converters: 1
• Power Dissipation (max): 230µW
• Voltage Supply Source: Single Supply
• Operating Temperature: -40°C ~ 105°C
• Mounting Type: Surface Mount
• Package / Case: 10-TFSOP (0.118", 3.00mm Width)
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant

AD7788/AD7789
ABSOLUTE MAXIMUM RATINGS
T
Table 5.
Parameter
V
Analog Input Voltage to GND
Reference Input Voltage to GND
Total AIN/REFIN Current (Indefinite)
Digital Input Voltage to GND
Digital Output Voltage to GND
Operating Temperature Range
Storage Temperature Range
Maximum Junction Temperature
10-Lead MSOP
Lead Temperature, Soldering (10 sec)
IR Reflow, Peak Temperature
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
DD
A
B Grade
A Grade
θ
θ
= 25°C, unless otherwise noted.
to GND
JA
JC
Thermal Impedance
Thermal Impedance
Rating
−0.3 V to +7 V
−0.3 V to V
−0.3 V to V
30 mA
−0.3 V to V
−0.3 V to V
−40°C to +105°C
−40°C to +85°C
−65°C to +150°C
150°C
206°C/W
44°C/W
300°C
220°C
DD
DD
DD
DD
+ 0.3 V
+ 0.3 V
+ 0.3 V
+ 0.3 V
Rev. B | Page 8 of 20
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.