SCAN12100TYA/NOPB National Semiconductor, SCAN12100TYA/NOPB Datasheet - Page 21

• Manufacturer Part Number: SCAN12100TYA/NOPB
• Description: IC SERIAL/DESERIAL CPRI 100-TQFP
• Manufacturer: National Semiconductor
• Series: SCANr

Specifications of SCAN12100TYA/NOPB

• Function: Serializer/Deserializer
• Data Rate: 614.4Mbps
• Input Type: LVTTL/LVCMOS
• Output Type: LVTTL, LVCMOS
• Number Of Inputs: 10
• Number Of Outputs: 10
• Voltage - Supply: 1.8 V ~ 3.3 V
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Surface Mount
• Package / Case: 100-TQFP Exposed Pad, 100-eTQFP, 100-HTQFP, 100-VQFP
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: SCAN12100TYA

IEEE 1149.1 (JTAG) and 1149.6 Operation
The SCAN12100 supports a fully compliant IEEE 1149.1 in-
terface. The Test Access Port (TAP) provides access to
boundary scan cells at single-ended pins for interconnect
testing. The TAP also provides access to the IEEE 1149.6 test
features for differential pins. Refer to the (Boundary SCAN
Description Language (BSDL) file located on National's web-
site for the details of the IEEE1149.1 and 1149.6 implemen-
tation.
JTAG BIST and Enhanced BIST mode
The SCAN12100’s at-speed BIST pattern generation and
verification feature is normally accessed via the MDIO pro-
gramming interface, however, the BIST can also be accessed
through the JTAG bus. Access to the JTAG BIST command
requires the SCAN12100 be run in local loopback BIST mode
while RXCLK and ROUT[9:0] outputs are held in Tri-State.
Under this mode, the device requires the REFCLKP/N input
at 30.72MHz and runs PRWS10 pattern at 1.2288 Gbps.
In addition to this JTAG BIST, SCAN12100 can be re-pro-
grammed to operate in normal mode transceiver link mode,
local loopback modes, all valid speed modes, all valid de-em-
phasis modes, and all valid equalization modes. To activate
this advanced feature, a BSAMPLE instruction is executed.
Then select data shift register and shift in the register of this
order: {PE[1], PE[0], EQ[0], EQ[1], SPMODE[0], SPMODE[1],
LOCAL_EN} On the TDI input, the generator will shift in a
pattern that starts with LOCAL_EN and ends with PE[1]. For
example, to set the device into 1.2288 Gbps with max EQ,
max PE, and normal mode, shift from left to right 0, 1, 0, 1, 1,
1, and 1. SPMODE[1:0], PE[1:0], and EQ[1:0] follow the def-
initions in the datasheet except that MDIO will not override
these parameters. The device default mode when SPMODE
[1:0] = 2’b00 is 1.2288 Gbps. EQ[1:0] = 2’b00 and PE[1:0] =
2’b00 disable equalization and de-emphasis. Once the proper
data has been shifted into the BSAMPLE data register, exe-
21
cuting the JTAG BIST command places the device into BIST
mode.
National recommends JTAG BIST run for at least 300ms to
ensure BIST has been completed. Once 300ms has passed,
the BIST result can be read through the data shift register.
The output is mapped as follows: {BIST START, BIST COM-
PLETE, and BIST ERROR.} BIST START is shifted out first
with BIST_ERROR last. If the test has been completed and
passed, the shifted results will be 0, 1, and 1. If the
BIST_START is 0, the receiver can not detect the BIST signal.
If BIST_COMPLETE is 0, BIST run time is not long enough.
If the BIST_ERROR goes 1, at least one bit error has oc-
curred.
Instruction codes and device pin out are documented in the
SCAN12100 BSDL file.
Precision Delay Calibration
Measurement (DCM)
The SCAN12100 DCM circuitry delivers CPRI link and mea-
surements, enabling the next generation distributed multi-hop
base station architectures as well as advanced diversity,
beam forming, and MIMO antenna systems. The DCM pre-
cisely measures absolute T14 and Toffset delays to better
than ± 800 ps and can track delay changes (in fiber optics for
example) with a resolution of 100’s of picoseconds. Measure-
ments are accessed via the MDIO interface as often as every
5 ms without interrupting CPRI link operation. The
SCAN12100 not only reports accurate CPRI link and chip de-
lays (chip latency is deterministic), but also enables mea-
surement of intra-module RE timing such as TBdelays.
For more information about using DCM, ask your local Na-
tional Semiconductor sales representative for the application
note:
Semiconductor’s SCAN25100.”
"Precision
Delay
Calibration
using
www.national.com
National