CY7C1312AV18-133BZC Cypress Semiconductor Corp, CY7C1312AV18-133BZC Datasheet - Page 17

• Manufacturer Part Number: CY7C1312AV18-133BZC
• Manufacturer: Cypress Semiconductor Corp

Specifications of CY7C1312AV18-133BZC

• Lead Free Status / Rohs Status: Supplier Unconfirmed

Document #: 38-05497 Rev. *A
TAP AC Switching Characteristics
TAP Timing and Test Conditions
26. t
27. Test conditions are specified using the load in TAP AC test conditions. t
t
t
t
t
Set-up Times
t
t
t
Hold Times
t
t
t
Output Times
t
t
TCYC
TF
TH
TL
TMSS
TDIS
CS
TMSH
TDIH
CH
TDOV
TDOX
Parameter
CS
and t
TDO
CH
refer to the set-up and hold time requirements of latching data from the boundary scan register.
TCK Clock Cycle Time
TCK Clock Frequency
TCK Clock HIGH
TCK Clock LOW
TMS Set-up to TCK Clock Rise
TDI Set-up to TCK Clock Rise
Capture Set-up to TCK Rise
TMS Hold after TCK Clock Rise
TDI Hold after Clock Rise
Capture Hold after Clock Rise
TCK Clock LOW to TDO Valid
TCK Clock LOW to TDO Invalid
Z
0
= 50Ω
Test Mode Select
TMS
Test Clock
TCK
Test Data-In
TDI
Test Data-Out
TDO
(a)
GND
0.9V
C
50Ω
L
= 20 pF
[27]
Over the Operating Range
Description
PRELIMINARY
t
TMSS
t
TDIS
R
/t
F
= 1 ns.
t
TH
0V
[26, 27]
t
t
TDOV
TL
t
t
TMSH
TDIH
1.8V
ALL INPUT PULSES
0.9V
t
TCYC
t
TDOX
Min.
100
40
40
10
10
10
10
10
10
0
CY7C1310AV18
CY7C1312AV18
CY7C1314AV18
Max.
10
20
Page 17 of 21
MHz
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns