LM2412 National Semiconductor, LM2412 Datasheet - Page 2

• Manufacturer Part Number: LM2412
• Description: Monolithic Triple 2.8 ns CRT Driver
• Manufacturer: National Semiconductor

www.national.com
I
I
V
A
LE
t
t
OS
CC
BB
r
f
Symbol
Electrical Characteristics
Note 1: “Absolute Maximum Ratings” are those values beyond which the safety of the device cannot be guaranteed. They are not meant to imply that the devices
should be operated at these limits. The table of “Electrical Characteristics” specifies conditions of device operation.
Note 2: All voltages are measured with respect to GND, unless otherwise specified.
Note 3: Operating ratings indicate conditions for which the device is functional, but do not guarantee specific performance limits. For guaranteed specifications and
test conditions, see the Electrical Characteristics. The guaranteed specifications apply only for the test conditions listed. Some performance characteristics may
change when the device is not operated under the listed test conditions.
Note 4: Calculated value from voltage gain test on each channel.
Note 5: Linearity error is the variation in DC gain from V
Note 6: Input from signal generator: t
Note 7: 100% tested in production. These limits are not used to calculate outgoing quality levels.
AC Test Circuit
Absolute Maximum Ratings
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
(See Figure 2 for Test Circuit)
Unless otherwise noted: V
A
Figure 2 shows a typical test circuit for evaluation of the
LM2412. This circuit is designed to allow testing of the
LM2412 in a 50
sive FET probe. The combined resitors of 4950
put form a 200:1 voltage divider when connected to a 50
load. The test board supplied by NSC also offers the option
to test theLM2412 with a FET probe. C
OUT
V
Supply Voltage, V
Bias Voltage, V
Input Voltage, V
Storage Temperature Range, T
Lead Temperature (Soldering,
V
Supply Current
Bias Current
DC Output Voltage
DC Voltage Gain
Gain Matching
Linearity Error
Rise Time (Notes 6, 7)
Fall Time (Notes 6, 7)
Overshoot
BB
IN
environment without the use of an expen-
CC
Parameter
CC
r
= +80V, V
, t
f
<
STG
<
10 sec.)
1 ns.
L
BB
is the total capaci-
−65˚C to +150˚C
= +12V, V
FIGURE 2. Test Circuit (One Channel)
IN
Per Channel, No Output Load
All Three Channels
V
(Note 4)
(Notes 4, 5)
10% to 90%, 40 V
10% to 90%, 40 V
40 V
= 1.6V to V
IN
(Notes 1, 2)
at the out-
0V to 6V
= 1.9V
PP
300˚C
+90V
+16V
Output (1 MHz)
IN
IN
= +3.3 V
= 5.0V.
Conditions
2
PP
PP
DC
Output (1 MHz)
Output (1 MHz)
Operating Ranges
tance at the LM2412 output, including the board capaci-
tance.
, C
ESD Tolerance
V
V
V
V
Case Temperature
Do not operate the part without a heat sink.
CC
BB
IN
OUT
Human Body Model
Machine Model
L
= 8 pF, T
(V
CC
= 80V, V
C
= 60˚C, no AC input.
BB
Min
−12
= 12V)
16
27
62
(Note 3)
LM2412
Typ
−14
1.0
3.5
2.8
2.8
21
42
65
5
−20˚C to +100˚C
+60V to +85V
+15V to +75V
Max
−16
3.5
3.5
26
57
68
+8V to +15V
DS101298-3
+1V to +5V
250V
2 kV
Units
V
mA
mA
dB
ns
ns
%
%
DC