6N137_07 TOSHIBA [Toshiba Semiconductor], 6N137_07 Datasheet - Page 5

• Manufacturer Part Number: 6N137_07
• Description: GaA?As Ired & Photo IC Degital Logic Isolation
• Manufacturer: TOSHIBA [Toshiba Semiconductor]

Test Circuit 1.
Test Circuit 2.
Test Circuit 3.
Input
Output V
Input V
Output V
Transient immunity and typical waveforms
t
pHL
t
EHL
and t
E
O
and t
O
pLH
ELH
･ C
V
V
O
O
t
･ C
pHL
t
L
EHL
is approximately 15pF which includes prove and stray wiring capacitance.
10%
L
Switch at A : I
Switching at B : I
is approximately 15pF which includes probe and stray wiring capacitance.
90%
t
t
pLH
t
r
ELH
F
175mV(I
= 0mA
350mV(I
1.5V
10%
3.0V
F
= 5mA
1.5V
1.5V
F
F
= 3.75mA)
= 7.5mA)
90%
V
V
t
V
f
V
OH
OL
OH
OL
5
Monitoring
10V
5V
0V
V
OL
Pulse
generator
Z
t
r
O
Pulse
generator
Z
t
= 5ns
r
O
= 50Ω
= 5ns
Node
= 50Ω
I
V
7.5mA
F
FF
dc
I
F
B
A
Input V
Monitoring node
I
F
2
1
3
4
2
1
4
3
Pulse gen.
Z
E
O
1
2
3
4
= 50Ω.
GND
GND
V
V
CC
CC
8
7
6
5
GND
8
6
7
5
V
V
CC
CM
0.1μF
By-
pass
0.1μF
By-
pass
C
8
7
6
5
C
2007-10-01
L
L
5V
0.1μF
5V
By-
pass
6N137
R
Output
V
monitor-
ing
node
R
V
Output
monitor-
ing
node
L
O
L
O
R
5V
L
V
O