AT28HC64B_08 ATMEL [ATMEL Corporation], AT28HC64B_08 Datasheet - Page 5

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AT28HC64B_08

Manufacturer Part Number
AT28HC64B_08
Description
64K (8K x 8) High Speed Parallel EEPROM with Page Write and Software Data Protection
Manufacturer
ATMEL [ATMEL Corporation]
Datasheet
5. DC and AC Operating Range
6. Operating Modes
Notes:
7. Absolute Maximum Ratings*
8. DC Characteristics
Note:
0274K–PEEPR–8/08
Operating Temperature (Case)
V
Mode
Read
Write
Standby/Write Inhibit
Write Inhibit
Write Inhibit
Output Disable
Chip Erase
Temperature Under Bias................................ -55°C to +125°C
Storage Temperature ..................................... -65°C to +150°C
All Input Voltages
(including NC Pins)
with Respect to Ground .................................-0.6 V to +6.25 V
All Output Voltages
with Respect to Ground ...........................-0.6 V to V
Voltage on OE and A9
with Respect to Ground ..................................-0.6 V to +13.5V
Symbol
I
I
I
I
I
V
V
V
V
LI
LO
SB1
SB2
CC
CC
IL
IH
OL
OH
Power Supply
(2)
1. X can be VIL or VIH.
2.
3. VH = 12.0 V ±0.5 V.
1. I
See “AC Write Waveforms” on page 8.
SB1
Parameter
Input Load Current
Output Leakage Current
V
V
V
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
CC
CC
CC
and I
Active Current
Standby Current CMOS
Standby Current TTL
SB2
for the 55 ns part is 40 mA maximum.
AT28HC64B-70
-40°C - 85°C
5 V ±10%
CC
Condition
V
V
CE = V
CE = 2.0 V to V
f = 5 MHz; I
I
I
OL
OH
CE
V
V
V
V
IN
I/O
X
X
X
+ 0.6 V
IL
IL
IH
IL
= 2.1 mA
= -400 µA
= 0 V to V
= 0 V to V
CC
- 0.3 V to V
OUT
CC
CC
= 0 mA
CC
+ 1 V
*NOTICE:
+ 1 V
CC
V
OE
V
V
V
X
V
+ 1 V
X
H
IL
IH
(1)
IL
IH
(3)
AT28HC64B-90
-40°C - 85°C
5 V ±10%
Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam-
age to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reliability
Min
2.0
2.4
WE
V
V
V
V
X
X
X
IH
IH
IL
IL
AT28HC64B
AT28HC64B-120
100
Max
0.40
-40°C - 85°C
2
0.8
10
10
40
5 V ±10%
(1)
(1)
High Z
High Z
High Z
D
I/O
D
OUT
IN
Units
mA
mA
µA
µA
µA
V
V
V
V
5

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