ISPLSI2032 Lattice Semiconductor, ISPLSI2032 Datasheet - Page 4

no-image

ISPLSI2032

Manufacturer Part Number
ISPLSI2032
Description
(ISPLSI2032/A) In-System Programmable SuperFAST High Density PLD
Manufacturer
Lattice Semiconductor
Datasheet

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
ISPLSI2032-110LJ
Manufacturer:
LATTICE
Quantity:
5 510
Part Number:
ISPLSI2032-110LJ
Manufacturer:
MICROCHIP
Quantity:
5 510
Part Number:
ISPLSI2032-110LJ
Manufacturer:
LATTICE
Quantity:
20 000
Part Number:
ISPLSI2032-110LT44
Manufacturer:
L
Quantity:
6 218
Part Number:
ISPLSI2032-110LT44
Manufacturer:
LATTICE
Quantity:
20 000
Part Number:
ISPLSI2032-110LT44KJ
Manufacturer:
SHARP
Quantity:
10
Part Number:
ISPLSI2032-135LJ
Manufacturer:
LATTICE
Quantity:
12 388
Part Number:
ISPLSI2032-135LJ
Manufacturer:
LATTICE
Quantity:
20 000
Part Number:
ISPLSI2032-150LT44
Manufacturer:
LATTICE
Quantity:
20 000
Part Number:
ISPLSI2032-180LT48
Manufacturer:
LATTICE
Quantity:
20 000
Part Number:
ISPLSI2032-80 LJ
Manufacturer:
LATTICE
Quantity:
24
Part Number:
ISPLSI2032-80LJ
Manufacturer:
NS
Quantity:
8
Part Number:
ISPLSI2032-80LJ
Quantity:
200
Part Number:
ISPLSI2032-80LJ
Manufacturer:
LATTICE
Quantity:
1 000
Part Number:
ISPLSI2032-80LJ
Manufacturer:
LATTICE
Quantity:
1 000
1. One output at a time for a maximum duration of one second. V
2. Measured using two 16-bit counters.
3. Typical values are at V = 5V and T = 25°C.
4. Maximum I
Output Load Conditions (see Figure 2)
Input Pulse Levels
Input Rise and Fall Time
10% to 90%
Input Timing Reference Levels
Output Timing Reference Levels
Output Load
3-state levels are measured 0.5V from
steady-state active level.
V
V
I
I
I
I
I
I
Switching Test Conditions
DC Electrical Characteristics
SYMBOL
IL
IH
IL-isp
IL-PU
OS
CC
by tester ground degradation. Characterized but not 100% tested.
OL
OH
section of this data sheet and Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM to
estimate maximum I
C
A
B
1
2, 4
TEST CONDITION
Active High
Active Low
Active High to Z
at V -0.5V
Active Low to Z
at V +0.5V
Output Low Voltage
Output High Voltage
Input or I/O Low Leakage Current
Input or I/O High Leakage Current
ispEN Input Low Leakage Current
I/O Active Pull-Up Current
Output Short Circuit Current
Operating Power Supply Current
OH
OL
CC
varies widely with specific device configuration and operating frequency. Refer to the Power Consumption
PARAMETER
CC
CC
.
-135, -150, -180
-80, -110
470Ω
470Ω
470Ω
A
R1
Over Recommended Operating Conditions
GND to 3.0V
See Figure 2
1.5V
1.5V
390Ω
390Ω
390Ω
390Ω
390Ω
R2
I = 8 mA
I
0V ≤ V ≤ V (Max.)
3.5V ≤ V ≤ V
0V ≤ V ≤ V
0V ≤ V ≤ V
V = 5V, V
V = 0.0V, V = 3.0V
f
OL
OH
TOGGLE
Table 2-0003/2032
CC
IL
Table 2 - 0004A
≤ 1.5 ns
= -4 mA
≤ 3 ns
35pF
35pF
35pF
IN
IN
IN
5pF
5pF
CL
= 1 MHz
IN
OUT
IL
IL
IL
IH
CC
= 0.5V
4
CONDITION
Figure 2. Test Load
OUT
Specifications ispLSI 2032/A
= 0.5V was selected to avoid test problems
*
Device
Output
C L includes Test Fixture and Probe Capacitance.
Comm.
Industrial
Others
-180, -150
+ 5V
R 1
R 2
MIN.
2.4
TYP.
40
40
60
C L
*
3
MAX. UNITS
-150
-150
-200
0.4
-10
10
Table 2-0007/2032
Point
Test
0213A
mA
mA
mA
mA
µA
µA
µA
µA
V
V

Related parts for ISPLSI2032