K7D801871B-HC30 Samsung semiconductor, K7D801871B-HC30 Datasheet - Page 9

• Manufacturer Part Number: K7D801871B-HC30
• Description: 256Kx36 & 512Kx18 SRAM
• Manufacturer: Samsung semiconductor

K7D803671B
K7D801871B
AC TEST OUTPUT LOAD 1
AC TEST OUTPUT LOAD 2
AC TEST CONDITIONS 1
AC TEST CONDITIONS 2
Output Timing Reference Level
Input High/Low Level
Input Reference Level
Input Rise/Fall Time
Clock Input Timing Reference Level
Output Load
Input High/Low Level
Input Reference Level
Input Rise/Fall Time
Output Timing Reference Level
Clock Input Timing Reference Level
Output Load
Parameter
Parameter
DQ
DQ
25
25
(T
(T
A
A
=0 to 70 C, V
=0 to 70 C, V
DD
DD
=2.37 -2.63V, V
=2.37 -2.63V, V
50
50
50
50
Symbol
Symbol
V
V
T
T
V
V
IH
IH
R
R
REF
REF
/V
/T
/V
/T
- 9 -
F
F
IL
IL
5pF
5pF
0.75V
0.9V
5pF
5pF
DDQ
DDQ
=1.5V)
=1.8V)
50
50
256Kx36 & 512Kx18 SRAM
50
50
Cross Point
Cross Point
See Below
See Below
1.25/0.25
1.64/0.18
0.5/0.5
0.5/0.5
Value
Value
0.75
0.75
0.9
0.9
0.75V
0.9V
0.75V
0.9V
Unit
Unit
ns
ns
V
V
V
V
V
V
V
V
January. 2002
Note
Note
Rev 4.0
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