AD847SQ883B Analog Devices, AD847SQ883B Datasheet - Page 10

• Manufacturer Part Number: AD847SQ883B
• Description: OP Amp Single GP ?18V 8-Pin CDIP
• Manufacturer: Analog Devices

DSCC FORM 2234
APR 97
approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to
listing as an approved source of supply shall affirm that the manufacturer's product meets the requirements of MIL-PRF-38535,
appendix A and the requirements herein.
with each lot of microcircuits delivered to this drawing.
facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the
reviewer.
appendix A.
prior to quality conformance inspection. The following additional criteria shall apply:
883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3.2 Groups C and D inspections.
3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an
3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided
3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing.
3.9 Verification and review. DSCC, DSCC's agent, and the acquiring activity retain the option to review the manufacturer's
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535,
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-
4.3.1 Group A inspection.
a.
a.
b.
a.
b.
b.
(1) Test condition B. The test circuit shall be maintained by the manufacturer under document revision level control
(2) T
(1)
(2)
(3)
DEFENSE SUPPLY CENTER COLUMBUS
Burn-in test, method 1015 of MIL-STD-883.
Tests shall be as specified in table II herein.
Subgroups 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.
End-point electrical parameters shall be as specified in table II herein.
Steady-state life test conditions, method 1005 of MIL-STD-883.
tests prior to burn-in are optional at the discretion of the manufacturer.
Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015
of MIL-STD-883.
A
MICROCIRCUIT DRAWING
Test condition B. The test circuit shall be maintained by the manufacturer under document revision level control
and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method
1005 of MIL-STD-883.
T
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
= +125C, minimum.
COLUMBUS, OHIO 43218-3990
A
= +125C, minimum.
STANDARD
SIZE
A
REVISION LEVEL
B
SHEET
5962-89647
10