LCMXO2-4000ZE-1MG132C Lattice, LCMXO2-4000ZE-1MG132C Datasheet - Page 11

• Manufacturer Part Number: LCMXO2-4000ZE-1MG132C
• Description: FPGA - Field Programmable Gate Array 4320 LUTs 105 IO 1.2V 1 Spd
• Manufacturer: Lattice

Specifications of LCMXO2-4000ZE-1MG132C

• Rohs: yes
• Number Of Gates: 4 K
• Embedded Block Ram - Ebr: 92 Kbit
• Number Of I/os: 105
• Maximum Operating Frequency: 104 MHz
• Operating Supply Voltage: 1.14 V to 1.26 V, 1.14 V to 3.465 V
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• Package / Case: csBGA-132
• Distributed Ram: 34 Kbit
• Minimum Operating Temperature: 0 C
• Operating Supply Current: 124 uA
• Factory Pack Quantity: 360
• User Flash Memory - Ufm: 96 Kbit

* ELFR units did not receive Flash cell pre-condition cycling prior to stress.
** FTG256 packaged units did not receive Flash cell pre-condition cycling prior to stress.
A: FAR#1389: One temperature-sensitive device was a test escape Pre-HTOL stress. Not an HTOL failure. Unit removed from sample size.
B: FAR#1390: One working unit at 1k hr failed for flash “readback. Flash verified as good. Intermittent “Read” circuit. Not able to localize.
C: No FAR. One unit mechanically damaged due to handling. No longer able to retest that device. Unit removed from sample size.
D: Two (2) pre-production ELFR failures due to too-thin ILD0. A pre-production corrective & preventive process change was incorporated
and then validated using Flash Extended Endurance, High Temperature Data Retention, and High Temperature Operating Life stresses.
INDEX Return
LCMXO2-1200HE
LCMXO2-1200HC
LCMXO2-1200HE
LCMXO2-1200HC
LCMXO2-1200HE
LCMXO2-1200HC
LCMXO2-1200HE
LCMXO2-1200HC
LCMXO2-1200HE
LCMXO2-1200HC
LCMXO2-7000HE
LCMXO2-7000HC
LCMXO2-7000HE
LCMXO2-7000HC
LCMXO2-7000HE
LCMXO2-7000HC
LCMXO2-7000HE
LCMXO2-7000HC
LCMXO2-1200ZE
LCMXO2-1200ZE
LCMXO2-1200ZE
LCMXO2-1200ZE
LCMXO2-1200ZE
LCMXO2-7000ZE
LCMXO2-7000ZE
LCMXO2-7000ZE
LCMXO2-7000ZE
Product Name
Package
FTG256
FTG256
FTG256
FTG256
FTG256
FTG256
MG132
MG132
MG132
MG132
MG132
MG132
MG132
MG132
MG132
TG144
TG144
TG144
TG144
TG144
TG144
TG144
TG144
TG144
TG144
TG144
TG144
Lot #3
Lot #3
Lot #3
Lot #3
Lot #3
Lot #3
Lot #3
Lot #3
Lot #3
Lot #6
Lot #6
Lot #6
Lot #6
Lot #6
Lot #6
Lot #1
Lot #1
Lot #1
Lot #1
Lot #1
Lot #1
Lot #2
Lot #2
Lot #2
Lot #2
Lot #2
Lot #2
Lot #
MachXO2 Cumulative Life Testing Device Hours = 2,344,000
MachXO2 Cumulative Result = 1 confirmed failure at 1000 hours
MachXO2 Long Term Failure Rate = 10 FIT
FIT Assumptions: CL=60%, AE=0.7eV, Tjref=55C
MachXO2 HTOL (2000 Hrs) Cumulative Result / Sample Size = 0 / 532
MachXO2 HTOL (1000 Hrs) Cumulative Result / Sample Size = 1 / 1,812
MachXO2 ELFR (48HRS or 168Hrs) Cumulative Result / Sample Size = 2
300*
299*
300*
40**
40**
40**
40**
40**
40**
Qty
59
60
60
50
49
50
60
60
60
48
49
50
50
48
48
50
48
48
48 Hrs
Result
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
0
0
0
11
168 Hrs
Result
N/A
N/A
N/A
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
500 Hrs
Result
N/A
N/A
N/A
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Lattice Semiconductor Corporation Doc. #25-106923 Rev. F
1000 Hrs
Result
N/A
N/A
N/A
1
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
B
2000 Hrs
Result
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Cumulative
100,000
100,000
100,000
100,000
59,000
60,000
60,000
98,000
60,000
60,000
60,000
48,000
49,000
50,000
80,000
80,000
80,000
96,000
96,000
80,000
80,000
80,000
96,000
96,000
Hours
D
N/A
N/A
N/A
/ 4,503