LCMXO2-4000ZE-1MG132C Lattice, LCMXO2-4000ZE-1MG132C Datasheet - Page 24

• Manufacturer Part Number: LCMXO2-4000ZE-1MG132C
• Description: FPGA - Field Programmable Gate Array 4320 LUTs 105 IO 1.2V 1 Spd
• Manufacturer: Lattice

Specifications of LCMXO2-4000ZE-1MG132C

• Rohs: yes
• Number Of Gates: 4 K
• Embedded Block Ram - Ebr: 92 Kbit
• Number Of I/os: 105
• Maximum Operating Frequency: 104 MHz
• Operating Supply Voltage: 1.14 V to 1.26 V, 1.14 V to 3.465 V
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• Package / Case: csBGA-132
• Distributed Ram: 34 Kbit
• Minimum Operating Temperature: 0 C
• Operating Supply Current: 124 uA
• Factory Pack Quantity: 360
• User Flash Memory - Ufm: 96 Kbit

4.3 MachXO2 Product Family Unbiased HAST Data
Unbiased Highly Accelerated Stress Test (HAST) testing uses both pressure and temperature to accelerate
penetration of moisture into the package and to the die surface. The Unbiased HAST test is designed to detect
ionic contaminants present within the package or on the die surface, which can cause chemical corrosion.
Consistent with JEDEC JESD22-A118, “Accelerated Moisture Resistance - Unbiased HAST,” the Unbiased
HAST conditions are either 96 hours exposure at 130°C and 85% relative humidity (Condition A), or 264 hours
exposure at 110°C and 85% relative humidity (Condition B). Prior to Unbiased HAST testing, all devices are
subjected to Surface Mount Preconditioning.
MSL3 Packages: TQFP, csBGA
Stress Conditions: 110°C and 85% RH (Condition B)
Stress Duration: 264 Hrs (Condition B)
Method: Lattice Procedure # 70-104285 and JESD22-A118
INDEX Return
Table 4.3.1: Unbiased HAST Data
Product Name
LCMXO2-1200
LCMXO2-1200
LCMXO2-1200
LCMXO2-1200
LCMXO2-1200
LCMXO2-1200
LCMXO2-7000
LCMXO2-7000
LCMXO2-7000
132csBGA
132csBGA
132csBGA
484fpBGA
484fpBGA
484fpBGA
144TQFP
144TQFP
144TQFP
Package
Assembly
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
Site
Lot Number
Lot #1
Lot #2
Lot #3
Lot #1
Lot #2
Lot #3
Lot #1
Lot #2
Lot #3
MachXO2 Cumulative Unbiased HAST failure Rate = 0 / 691
24
Quantity
77
77
77
77
77
77
76
77
76
Lattice Semiconductor Corporation Doc. #25-106923 Rev. F
# of Fails
0
0
0
0
0
0
0
0
0
Temperature
Stress
110°C
110°C
110°C
110°C
110°C
110°C
110°C
110°C
110°C
Duration
264 Hrs
264 Hrs
264 Hrs
264 Hrs
264 Hrs
264 Hrs
264 Hrs
264 Hrs
264 Hrs
Stress