LCMXO2-2000HC-4MG132I Lattice, LCMXO2-2000HC-4MG132I Datasheet - Page 23

• Manufacturer Part Number: LCMXO2-2000HC-4MG132I
• Description: FPGA - Field Programmable Gate Array 2112 LUTs 105 IO 3.3V 4 Spd
• Manufacturer: Lattice

Specifications of LCMXO2-2000HC-4MG132I

• Rohs: yes
• Maximum Operating Frequency: 133 MHz
• Operating Supply Voltage: 2.5 V, 3.3 V
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• Package / Case: BGA-132
• Minimum Operating Temperature: - 40 C
• Operating Supply Current: 82 uA
• Factory Pack Quantity: 360

4.2 MachXO2 Product Family Temperature Cycling Data
The Temperature Cycling test is used to accelerate those failures resulting from mechanical stresses induced by
differential thermal expansion of adjacent films, layers and metallurgical interfaces in the die and package.
Devices are tested at 25°C after exposure to repeated cycling between -55°C and +125°C in an air environment
consistent with JEDEC JESD22-A104 “Temperature Cycling”, Condition B temperature cycling requirements.
Prior to Temperature Cycling testing, all devices are subjected to Surface Mount Preconditioning.
MSL3 Packages: TQFP, csBGA, QFN
Stress Duration: 1000 cycles
Stress Conditions: Temperature cycling between -55°C to 125°C
Method: Lattice Procedure # 70-101568 and JESD22-A104C, Condition B
Table 4.2.1: Temperature Cycling Data
* 1 unit had a broken lead due to handling
** 2 units had 1 corner solder ball knocked off
due to handling damage. Sample size reduced
by one for each of two assembly lots.
INDEX Return
damage. Sample size reduced by one.
Product Name
LCMXO2-1200
LCMXO2-1200
LCMXO2-1200
LCMXO2-4000
LCMXO2-4000
LCMXO2-4000
LCMXO2-7000
LCMXO2-7000
LCMXO2-1200
LCMXO2-1200
LCMXO2-1200
LCMXO2-7000
LCMXO2-7000
LCMXO2-7000
LCMXO2-7000
LCMXO2-7000
LCMXO2-256
LCMXO2-256
LCMXO2-256
LCMXO2-256
LCMXO2-256
332caBGA
332caBGA
132csBGA
132csBGA
132csBGA
184csBGA
184csBGA
184csBGA
484fpBGA
484fpBGA
484fpBGA
144TQFP
144TQFP
144TQFP
144TQFP
144TQFP
64ucBGA
64ucBGA
Package
32QFN
32QFN
32QFN
Assembly
ASEKH
ASEKH
ASEKH
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
Site
Lot Number
MachXO2 Cumulative Temp Cycle Failure Rate = 0 / 1,634
Lot #1
Lot #2
Lot #3
Lot #1
Lot #2
Lot #1
Lot #2
Lot #3
Lot #1
Lot #2
Lot #3
Lot #1
Lot #2
Lot #1
Lot #2
Lot #3
Lot #1
Lot #2
Lot #1
Lot #2
Lot #3
23
Quantity
76**
75**
76*
82
82
82
80
78
77
77
77
78
78
78
77
77
77
77
77
77
76
Lattice Semiconductor Corporation Doc. #25-106923 Rev. F
500 Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1000 Cycles
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0