EVAL-ADUC814QS Analog Devices Inc, EVAL-ADUC814QS Datasheet - Page 9

• Manufacturer Part Number: EVAL-ADUC814QS
• Description: KIT DEV FOR ADUC814 QUICK START
• Manufacturer: Analog Devices Inc
• Series: QuickStart™ Kitr
• Type: 8052-corer

Specifications of EVAL-ADUC814QS

• Contents: Evaluation Board, Power Supply, Cable, Software and Documentation
• For Use With/related Products: ADuC814
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant

ABSOLUTE MAXIMUM RATINGS
Table 2. Temperature = 25°C, unless otherwise noted
Parameter
AV
DV
AV
AGND to DGND
Analog Input Voltage to AGND
Reference Input Voltage to AGND
Analog Input Current (Indefinite)
Reference Input Current (Indefinite)
Digital Input Voltage to DGND
Digital Output Voltage to DGND
Operating Temperature Range
Storage Temperature Range
Junction Temperature
θ
Lead Temperature, Soldering
1
2
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
AGND and DGND are shorted internally on the ADuC814.
Applies to Pins P1.2 to P1.7 operating in analog or digital input mode.
JA
Vapor Phase (60 sec)
Infrared (15 sec)
DD
DD
DD
Thermal Impedance
to AGND
to DV
to AGND
DD
1
2
Rating
–0.3 V to +7 V
–0.3 V to +7 V
–0.3 V to +0.3 V
–0.3 V to +0.3 V
–0.3 V to AV
–0.3 V to AV
30 mA
30 mA
–0.3 V to DV
–0.3 V to DV
−40°C to +125°C
−65°C to +150°C
150°C
97.9°C/W
215°C
220°C
DD
DD
DD
DD
+ 0.3 V
+ 0.3 V
+ 0.3 V
+ 0.3 V
Rev. A | Page 9 of 72
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ADuC814