ATMEGA16L-8PU Atmel, ATMEGA16L-8PU Datasheet - Page 222
![IC AVR MCU 16K 8MHZ 3V 40DIP](/photos/6/70/67049/453-40-dip_sml.jpg)
ATMEGA16L-8PU
Manufacturer Part Number
ATMEGA16L-8PU
Description
IC AVR MCU 16K 8MHZ 3V 40DIP
Manufacturer
Atmel
Series
AVR® ATmegar
Datasheets
1.ATMEGA16L-8MI.pdf
(26 pages)
2.ATMEGA16L-8MI.pdf
(357 pages)
3.ATMEGA16-16PU.pdf
(358 pages)
Specifications of ATMEGA16L-8PU
Core Processor
AVR
Core Size
8-Bit
Speed
8MHz
Connectivity
I²C, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, POR, PWM, WDT
Number Of I /o
32
Program Memory Size
16KB (8K x 16)
Program Memory Type
FLASH
Eeprom Size
512 x 8
Ram Size
1K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 5.5 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
40-DIP (0.600", 15.24mm)
Processor Series
ATMEGA16x
Core
AVR8
Data Bus Width
8 bit
Data Ram Size
1 KB
Interface Type
JTAG/SPI/UART
Maximum Clock Frequency
8 MHz
Number Of Programmable I/os
32
Number Of Timers
3
Operating Supply Voltage
2.7 V to 5.5 V
Maximum Operating Temperature
+ 85 C
Mounting Style
Through Hole
3rd Party Development Tools
EWAVR, EWAVR-BL
Minimum Operating Temperature
- 40 C
On-chip Adc
8-ch x 10-bit
A/d Inputs
8-Channel, 10-Bit
Cpu Speed
8 MIPS
Eeprom Memory
512 Bytes
Input Output
32
Interface
JTAG/SPI/UART
Memory Type
Flash
Number Of Bits
8
Package Type
40-pin PDIP
Programmable Memory
16K Bytes
Timers
2-8-bit, 1-16-bit
Voltage, Range
2.7-5.5 V
For Use With
ATSTK600-TQFP44 - STK600 SOCKET/ADAPTER 44-TQFPATSTK600 - DEV KIT FOR AVR/AVR32770-1007 - ISP 4PORT ATMEL AVR MCU SPI/JTAGATJTAGICE2 - AVR ON-CHIP D-BUG SYSTEMATSTK500 - PROGRAMMER AVR STARTER KIT
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
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JTAG Interface
and On-chip
Debug System
Features
Overview
Test Access Port –
TAP
222
ATmega16(L)
•
•
•
•
•
The AVR IEEE std. 1149.1 compliant JTAG interface can be used for
•
•
•
A brief description is given in the following sections. Detailed descriptions for Programming via
the JTAG interface, and using the Boundary-scan Chain can be found in the sections
ming via the JTAG Interface” on page 278
228, respectively. The On-chip Debug support is considered being private JTAG instructions,
and distributed within ATMEL and to selected third party vendors only.
Figure 112
TAP Controller is a state machine controlled by the TCK and TMS signals. The TAP Controller
selects either the JTAG Instruction Register or one of several Data Registers as the scan chain
(Shift Register) between the TDI input and TDO output. The Instruction Register holds JTAG
instructions controlling the behavior of a Data Register.
The ID-Register, Bypass Register, and the Boundary-scan Chain are the Data Registers used
for board-level testing. The JTAG Programming Interface (actually consisting of several physical
and virtual Data Registers) is used for JTAG Serial Programming via the JTAG interface. The
Internal Scan Chain and Break Point Scan Chain are used for On-chip Debugging only.
The JTAG interface is accessed through four of the AVR’s pins. In JTAG terminology, these pins
constitute the Test Access Port – TAP. These pins are:
•
•
•
•
JTAG (IEEE std. 1149.1 Compliant) Interface
Boundary-scan Capabilities According to the IEEE std. 1149.1 (JTAG) Standard
Debugger Access to:
Programming of Flash, EEPROM, Fuses, and Lock Bits through the JTAG Interface
On-chip Debugging Supported by AVR Studio
– All Internal Peripheral Units
– Internal and External RAM
– The Internal Register File
– Program Counter
– EEPROM and Flash Memories
– Extensive On-chip Debug Support for Break Conditions, Including
– AVR Break Instruction
– Break on Change of Program Memory Flow
– Single Step Break
– Program Memory Breakpoints on Single Address or Address Range
– Data Memory Breakpoints on Single Address or Address Range
Testing PCBs by using the JTAG Boundary-scan capability
Programming the non-volatile memories, Fuses and Lock bits
On-chip Debugging
TMS: Test Mode Select. This pin is used for navigating through the TAP-controller state
machine.
TCK: Test Clock. JTAG operation is synchronous to TCK.
TDI: Test Data In. Serial input data to be shifted in to the Instruction Register or Data
Register (Scan Chains).
TDO: Test Data Out. Serial output data from Instruction register or Data Register.
shows a block diagram of the JTAG interface and the On-chip Debug system. The
and
®
“IEEE 1149.1 (JTAG) Boundary-scan” on page
2466R–AVR–06/08
“Program-
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