STM32F101V8T6 STMicroelectronics, STM32F101V8T6 Datasheet - Page 67

MCU ARM 64KB FLASH/TIMER 100LQFP

STM32F101V8T6

Manufacturer Part Number
STM32F101V8T6
Description
MCU ARM 64KB FLASH/TIMER 100LQFP
Manufacturer
STMicroelectronics
Series
STM32r
Datasheet

Specifications of STM32F101V8T6

Core Processor
ARM® Cortex-M3™
Core Size
32-Bit
Speed
36MHz
Connectivity
I²C, IrDA, LIN, SPI, UART/USART
Peripherals
DMA, PDR, POR, PVD, PWM, Temp Sensor, WDT
Number Of I /o
80
Program Memory Size
64KB (64K x 8)
Program Memory Type
FLASH
Ram Size
10K x 8
Voltage - Supply (vcc/vdd)
2 V ~ 3.6 V
Data Converters
A/D 16x12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
100-LQFP
Processor Series
STM32F101x
Core
ARM Cortex M3
Data Bus Width
32 bit
Data Ram Size
10 KB
Interface Type
I2C, SPI, USART
Maximum Clock Frequency
36 MHz
Number Of Programmable I/os
100
Number Of Timers
3 x 16 bit
Operating Supply Voltage
2 V to 3.6 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
EWARM, EWARM-BL, MDK-ARM, RL-ARM, ULINK2
Minimum Operating Temperature
- 40 C
On-chip Adc
12 bit, 16 Channel
For Use With
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Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
 Details
Other names
497-6060

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STM32F101x8, STM32F101xB
Equation 1: R
The formula above
error below 1/4 of LSB. Here N = 12 (from 12-bit resolution).
Table 43.
1. Guaranteed by design, not tested in production.
Table 44.
1. ADC DC accuracy values are measured after internal calibration.
2. ADC Accuracy vs. Negative Injection Current: Injecting negative current on any of the standard (non-
3. Based on characterization, not tested in production.
1.5
7.5
13.5
28.5
41.5
55.5
71.5
239.5
Symbol
R
robust) analog input pins should be avoided as this significantly reduces the accuracy of the conversion
being performed on another analog input. It is recommended to add a Schottky diode (pin to ground) to
standard analog pins which may potentially inject negative current.
Any positive injection current within the limits specified for I
affect the ADC accuracy.
EO
EG
ED
ET
EL
AIN
<
------------------------------------------------------------- - R
f
T
ADC
Total unadjusted error
Offset error
Gain error
Differential linearity error
Integral linearity error
s
R
(cycles)
ADC accuracy - limited test conditions
×
AIN
AIN
C
(Equation
ADC
Parameter
max for f
max formula:
T
S
×
ln
(
1) is used to determine the maximum external impedance allowed for an
2
ADC
N
Doc ID 13586 Rev 14
+
0.11
0.54
0.96
2.04
2.96
3.96
5.11
17.1
2
)
= 14 MHz
f
f
V
T
Measurements made after
ADC calibration
ADC
PCLK2
ADC
A
DDA
= 25 °C
= 14 MHz, R
(1)
= 3 V to 3.6 V
t
S
= 28 MHz,
Test conditions
(µs)
INJ(PIN)
AIN
(1) (2)
and ΣI
< 10 kΩ,
INJ(PIN)
0.4
5.9
11.4
25.2
37.2
50
NA
NA
Electrical characteristics
in
±1.3
±0.5
±0.7
±0.8
Typ
±1
Section 5.3.12
R
AIN
max (kΩ)
Max
±1.5
±1.5
±1.5
±1
±2
(3)
does not
Unit
LSB
67/87

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