ATMEGA1280-16AUR Atmel, ATMEGA1280-16AUR Datasheet - Page 305

• Manufacturer Part Number: ATMEGA1280-16AUR
• Description: MCU AVR 128K FLASH 16MHZ 100TQFP
• Manufacturer: Atmel
• Series: AVR® ATmegar

Specifications of ATMEGA1280-16AUR

• Core Processor: AVR
• Core Size: 8-Bit
• Speed: 16MHz
• Connectivity: EBI/EMI, I²C, SPI, UART/USART
• Peripherals: Brown-out Detect/Reset, POR, PWM, WDT
• Number Of I /o: 86
• Program Memory Size: 128KB (64K x 16)
• Program Memory Type: FLASH
• Eeprom Size: 4K x 8
• Ram Size: 8K x 8
• Voltage - Supply (vcc/vdd): 2.7 V ~ 5.5 V
• Data Converters: A/D 16x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 100-TQFP, 100-VQFP
• For Use With: ATSTK600-TQFP100 - STK600 SOCKET/ADAPTER 100-TQFPATSTK503 - STARTER KIT AVR EXP MODULE 100P
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

27.4.3
27.4.4
27.4.5
27.5
27.5.1
2549M–AVR–09/10
Boundary-scan Chain
SAMPLE_PRELOAD; 0x2
AVR_RESET; 0xC
BYPASS; 0xF
Scanning the Digital Port Pins
The active states are:
•
•
Mandatory JTAG instruction for pre-loading the output latches and taking a snap-shot of the
input/output pins without affecting the system operation. However, the output latches are not
connected to the pins. The Boundary-scan Chain is selected as Data Register.
The active states are:
•
•
•
The AVR specific public JTAG instruction for forcing the AVR device into the Reset mode or
releasing the JTAG reset source. The TAP controller is not reset by this instruction. The one bit
Reset Register is selected as Data Register. Note that the reset will be active as long as there is
a logic “one” in the Reset Chain. The output from this chain is not latched.
The active states are:
•
Mandatory JTAG instruction selecting the Bypass Register for Data Register.
The active states are:
•
•
The Boundary-scan chain has the capability of driving and observing the logic levels on the digi-
tal I/O pins, as well as the boundary between digital and analog logic for analog circuitry having
off-chip connection.
Figure 27-3 on page 306
function is disabled during Boundary-scan when the JTAG IC contains EXTEST or
SAMPLE_PRELOAD. The cell consists of a bi-directional pin cell that combines the three sig-
nals Output Control - OCxn, Output Data - ODxn, and Input Data - IDxn, into only a two-stage
Shift Register. The port and pin indexes are not used in the following description.
The Boundary-scan logic is not included in the figures in the datasheet.
shows a simple digital port pin as described in the section
ary-scan details from
307.
When no alternate port function is present, the Input Data - ID - corresponds to the PINxn Regis-
ter value (but ID has no synchronizer), Output Data corresponds to the PORT Register, Output
Capture-DR: Data in the IDCODE Register is sampled into the Boundary-scan Chain.
Shift-DR: The IDCODE scan chain is shifted by the TCK input.
Capture-DR: Data on the external pins are sampled into the Boundary-scan Chain.
Shift-DR: The Boundary-scan Chain is shifted by the TCK input.
Update-DR: Data from the Boundary-scan chain is applied to the output latches. However,
the output latches are not connected to the pins.
Shift-DR: The Reset Register is shifted by the TCK input.
Capture-DR: Loads a logic “0” into the Bypass Register.
Shift-DR: The Bypass Register cell between TDI and TDO is shifted.
Figure 27-3 on page 306
shows the Boundary-scan Cell for a bi-directional port pin. The pull-up
ATmega640/1280/1281/2560/2561
replaces the dashed box in
“I/O-Ports” on page
Figure 27-4 on page 307
Figure 27-4 on page
70. The Bound-
305