DF3048X16V Renesas Electronics America, DF3048X16V Datasheet - Page 730

• Manufacturer Part Number: DF3048X16V
• Description: MCU 5V 128K,PB-FREE 100-TQFP
• Manufacturer: Renesas Electronics America
• Series: H8® H8/300Hr

Specifications of DF3048X16V

• Core Processor: H8/300H
• Core Size: 16-Bit
• Speed: 16MHz
• Connectivity: SCI, SmartCard
• Peripherals: DMA, PWM, WDT
• Number Of I /o: 70
• Program Memory Size: 128KB (128K x 8)
• Program Memory Type: FLASH
• Ram Size: 4K x 8
• Voltage - Supply (vcc/vdd): 4.5 V ~ 5.5 V
• Data Converters: A/D 8x10b; D/A 2x8b
• Oscillator Type: Internal
• Operating Temperature: -20°C ~ 75°C
• Package / Case: 100-TQFP, 100-VQFP
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -

Section 22 Electrical Characteristics
Item
Write data delay time
Write data setup time 1
Write data setup time 2
Write data hold time
Read data access time 1
Read data access time 2
Read data access time 3
Read data access time 4
Precharge time
Wait setup time
Wait hold time
Bus request setup time
Bus acknowledge delay time 1
Bus acknowledge delay time 2
Bus-floating time
Note: * At 8 MHz, the times below depend as indicated on the clock cycle time.
Rev. 7.00 Sep 21, 2005 page 704 of 878
REJ09B0259-0700
At 16 MHz, the times below depend as indicated on the clock cycle time.
t
t
t
t
t
t
t
t
ACC1
ACC2
ACC3
ACC4
ACC1
ACC2
ACC3
ACC4
= 1.5
= 2.5
= 1.0
= 2.0
= 1.5
= 2.5
= 1.0
= 2.0
t
t
t
t
t
t
t
t
CYC
CYC
CYC
CYC
CYC
CYC
CYC
CYC
– 68 (ns)
– 73 (ns)
– 55 (ns)
– 70 (ns)
– 34 (ns)
– 37 (ns)
– 33 (ns)
– 30 (ns)
Symbol
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
WDD
WDS1
WDS2
WDH
ACC1
ACC2
ACC3
ACC4
PCH
WTS
WTH
BRQS
BACD1
BACD2
BZD
*
*
*
*
*
Min
—
60
5
25
—
—
—
—
85
40
10
40
—
—
—
t
t
t
t
t
t
WSW1
WSW2
PCH
WSW1
WSW2
PCH
Condition A
8 MHz
= 1.0
= 1.0
= 1.0
= 1.5
= 1.0
= 1.5
Max
75
—
—
—
120
240
70
180
—
—
—
—
60
60
70
t
t
CYC
CYC
t
t
t
t
CYC
CYC
CYC
CYC
– 40 (ns)
– 28 (ns)
– 40 (ns)
– 38 (ns)
– 28 (ns)
– 29 (ns)
Min
—
15
–5
20
—
—
—
—
45
25
5
40
—
—
—
Condition C
16 MHz
Max
60
—
—
—
60
120
30
95
—
—
—
—
30
30
40
Unit
ns
ns
ns
Test
Conditions
Figure 22.7,
Figure 22.8
Figure 22.9
Figure 22.21