PIC18F26K22-I/SO Microchip Technology, PIC18F26K22-I/SO Datasheet - Page 327
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PIC18F26K22-I/SO
Manufacturer Part Number
PIC18F26K22-I/SO
Description
IC PIC MCU 64KB FLASH 28SOIC
Manufacturer
Microchip Technology
Series
PIC® XLP™ 18Fr
Datasheets
1.PIC16F722-ISS.pdf
(8 pages)
2.PIC18F26J13-ISS.pdf
(496 pages)
3.PIC18F24K22-ISP.pdf
(494 pages)
Specifications of PIC18F26K22-I/SO
Core Size
8-Bit
Program Memory Size
64KB (32K x 16)
Core Processor
PIC
Speed
64MHz
Connectivity
I²C, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, HLVD, POR, PWM, WDT
Number Of I /o
24
Program Memory Type
FLASH
Eeprom Size
1K x 8
Ram Size
3.8K x 8
Voltage - Supply (vcc/vdd)
1.8 V ~ 5.5 V
Data Converters
A/D 19x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
28-SOIC (0.300", 7.50mm Width)
Controller Family/series
PIC18
No. Of I/o's
25
Eeprom Memory Size
1KB
Ram Memory Size
3896Byte
Cpu Speed
64MHz
No. Of Timers
7
Processor Series
PIC18F
Core
PIC
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Available stocks
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Manufacturer:
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Quantity:
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19.4
There are two separate methods of measuring
capacitance with the CTMU. The first is the absolute
method, in which the actual capacitance value is
desired. The second is the relative method, in which
the actual capacitance is not needed, rather an
indication of a change in capacitance is required.
19.4.1
For absolute capacitance measurements, both the
current and capacitance calibration steps found in
Section 19.3 “Calibrating the CTMU Module”
should be followed. Capacitance measurements are
then performed using the following steps:
1.
2.
3.
4.
5.
6.
7.
8.
2010 Microchip Technology Inc.
Initialize the A/D Converter.
Initialize the CTMU.
Set EDG1STAT.
Wait for a fixed delay, T.
Clear EDG1STAT.
Perform an A/D conversion.
Calculate the total capacitance, C
where I is known from the current source
measurement step (see Section 19.3.1 “Current
Source Calibration”), T is a fixed delay and V is
measured by performing an A/D conversion.
Subtract the stray and A/D capacitance
(C
Calibration”) from C
measured capacitance.
OFFSET
Measuring Capacitance with the
CTMU
ABSOLUTE CAPACITANCE
MEASUREMENT
from Section 19.3.2 “Capacitance
TOTAL
to determine the
TOTAL
= (I * T)/V,
Preliminary
19.4.2
An application may not require precise capacitance
measurements. For example, when detecting a valid
press of a capacitance-based switch, detecting a rela-
tive change of capacitance is of interest. In this type of
application, when the switch is open (or not touched),
the total capacitance is the capacitance of the combina-
tion of the board traces, the A/D Converter, etc. A larger
voltage will be measured by the A/D Converter. When
the switch is closed (or is touched), the total
capacitance is larger due to the addition of the
capacitance of the human body to the above listed
capacitances, and a smaller voltage will be measured
by the A/D Converter.
Detecting capacitance changes is easily accomplished
with the CTMU using these steps:
1.
2.
3.
4.
5.
The voltage measured by performing the A/D
conversion is an indication of the relative capacitance.
Note that in this case, no calibration of the current
source or circuit capacitance measurement is needed.
See Example 19-4 for a sample software routine for a
capacitive touch switch.
PIC18(L)F2X/4XK22
Initialize the A/D Converter and the CTMU.
Set EDG1STAT.
Wait for a fixed delay.
Clear EDG1STAT.
Perform an A/D conversion.
RELATIVE CHARGE
MEASUREMENT
DS41412A-page 327
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