AT91SAM7SE256B-CU Atmel, AT91SAM7SE256B-CU Datasheet - Page 49
![IC ARM7 MCU FLASH 256K 144-LFBGA](/photos/12/13/121356/144-lfbga_sml.jpg)
AT91SAM7SE256B-CU
Manufacturer Part Number
AT91SAM7SE256B-CU
Description
IC ARM7 MCU FLASH 256K 144-LFBGA
Manufacturer
Atmel
Series
AT91SAMr
Datasheet
1.AT91SAM7SE256-AU.pdf
(673 pages)
Specifications of AT91SAM7SE256B-CU
Core Processor
ARM7
Core Size
16/32-Bit
Speed
55MHz
Connectivity
EBI/EMI, I²C, SPI, SSC, UART/USART, USB
Peripherals
Brown-out Detect/Reset, POR, PWM, WDT
Number Of I /o
88
Program Memory Size
256KB (256K x 8)
Program Memory Type
FLASH
Ram Size
32K x 8
Voltage - Supply (vcc/vdd)
1.65 V ~ 1.95 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
*
Core
ARM7TDMI
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Details
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
- Current page: 49 of 673
- Download datasheet (11Mb)
12. Debug and Test Features
12.1
12.2
6222F–ATARM–14-Jan-11
Overview
Block Diagram
The SAM7SE Series Microcontrollers feature a number of complementary debug and test capa-
bilities. A common JTAG/ICE (Embedded ICE) port is used for standard debugging functions,
such as downloading code and single-stepping through programs. The Debug Unit provides a
two-pin UART that can be used to upload an application into internal SRAM. It manages the
interrupt handling of the internal COMMTX and COMMRX signals that trace the activity of the
Debug Communication Channel.
A set of dedicated debug and test input/output pins gives direct access to these capabilities from
a PC-based test environment.
Figure 12-1. Debug and Test Block Diagram
PDC
Boundary
ARM7TDMI
TAP
DBGU
ICE
ICE/JTAG
SAM7SE512/256/32 Preliminary
TAP
Reset
Test
and
POR
JTAGSEL
TDO
TMS
TCK
TDI
DTXD
DRXD
TST
49
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