GCM1885G1H150JA16D Murata Electronics North America, GCM1885G1H150JA16D Datasheet - Page 16

• Manufacturer Part Number: GCM1885G1H150JA16D
• Description: CAP CER 15PF 50V X8G SMD
• Manufacturer: Murata Electronics North America
• Series: GCMr

Specifications of GCM1885G1H150JA16D

• Voltage - Rated: 50V
• Lead Style: *
• Capacitance: 15pF
• Tolerance: ±5%
• Temperature Coefficient: X8G
• Mounting Type: *
• Operating Temperature: -55°C ~ 150°C
• Applications: Automotive
• Ratings: AEC-Q200
• Package / Case: *
• Size / Dimension: *
• Thickness: *
• Lead Spacing: *
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Features: -

1
!Note
• This PDF catalog is downloaded from the website of Murata Manufacturing co., ltd. Therefore, it’s specifications are subject to change or our products in it may be discontinued without advance notice. Please check with our
• This PDF catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
sales representatives or product engineers before ordering.
!Note
14
No.
*1: The figure indicates typical specification. Please refer to individual specifications.
GCM Series Specification and Test Methods
Specifications and Test Methods
1
2
3
4
5
6
Pre-and Post-Stress
Electrical Test
High Temperature
Exposure (Storage)
Temperature
Cycle
Destructive
Physical Analysis
Moisture
Resistance
Biased Humidity
• Please read rating and !CAUTION (for storage, operating, rating, soldering, mounting and handling) in this catalog to prevent smoking and/or burning, etc.
• This catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
AEC-Q200
Test Item
Appearance
Capacitance
Change
Q/D.F.
I.R.
Appearance
Capacitance
Change
Q/D.F.
I.R.
Appearance
Capacitance
Change
Q/D.F.
I.R.
Appearance
Capacitance
Change
Q/D.F.
I.R.
Temperature Compensating Type
The measured and observed characteristics should satisfy the
specifications in the following table.
No marking defects
Within 2.5% or 0.25pF
(Whichever is larger)
30pFmin.: QU1000
30pFmax.: QU400+20C
C: Nominal Capacitance (pF)
More than 10,000M or 500 · F
(Whichever is smaller)
The measured and observed characteristics should satisfy the
specifications in the following table.
No marking defects
Within 2.5% or 0.25pF
(Whichever is larger)
30pFmin.: QU1000
30pFmax.: QU400+20C
C: Nominal Capacitance (pF)
More than 10,000M or 500 · F
(Whichever is smaller)
No defects or abnormalities
The measured and observed characteristics should satisfy the
specifications in the following table.
No marking defects
Within 3.0% or 0.30pF
(Whichever is larger)
30pFmin.: QU350
10pF and over, 30pF and below:
QU275+
10pFmax.: QU200+10C
C: Nominal Capacitance (pF)
More than 10,000M or 500 · F
(Whichever is smaller)
The measured and observed characteristics should satisfy the
specifications in the following table.
No marking defects
Within 3.0% or 0.30pF
(Whichever is larger)
30pF and over: QU200
30pF and below: QU100+
C: Nominal Capacitance (pF)
More than 1,000M or 50 · F
(Whichever is smaller)
–
2
5
C
Specifications
1
–
3
0
C
Within 10.0%
W.V.: 25Vmin.: 0.03 max.
W.V.: 16V: 0.05 max.
Within 10.0%
W.V.: 25Vmin.: 0.03 max.
W.V.: 16V: 0.05 max.
Within 12.5%
W.V.: 25Vmin.: 0.03 max.
W.V.: 16V: 0.05 max.
Within 12.5%
W.V.: 25Vmin.: 0.035 max.
W.V.: 16V: 0.05 max.
*1
High Dielectric Type
*1
*1
*1
*1
*1
*1
*1
–
Sit the capacitor for 1000 12 hours at 150 3 C. Let sit for 24 2
hours at room temperature, then measure.
Fix the capacitor to the supporting jig in the same manner and
under the same conditions as (18). Perform the 1000 cycles
according to the four heat treatments listed in the following table.
Let sit for 24 2 hours at room temperature, then measure
• Initial measurement for high dielectric constant type
Perform a heat treatment at 150
let sit for 24 2 hours at room temperature.
Perform the initial measurement.
Per EIA-469
Apply the 24-hour heat (25 to 65 C) and humidity (80 to 98%)
treatment shown below, 10 consecutive times.
Let sit for 24 2 hours at room temperature, then measure.
Apply the rated voltage and 1.3+0.2/-0Vdc (add 6.8k
at 85 3 C and 80 to 85% humidity for 1000 12 hours.
Remove and let sit for 24 2 hours at room temperature, then
measure.
The charge/discharge current is less than 50mA.
Time (min.)
Temp. ( C)
Step
-10
70
65
60
65
50
45
40
35
30
25
20
15
10
-5
C
5
0
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24
Initial measurement
-55+0/-3
15 3
1
AEC-Q200 Test Method
Humidity
90-98%
+10
Temp.
Room
-2
One cycle 24 hours
2
Humidity
1
80-98%
C
Continued on the following page.
W0
Y10
125+3/-0 ( C/R7/C7)
Humidity
90-98%
Hours
C for one hour and then
15 3
Humidity
3
80-98%
Humidity
90-98%
Temp.
Room
resistor)
4
1
C03E.pdf
10.5.20