SI5110-H-BL Silicon Laboratories Inc, SI5110-H-BL Datasheet - Page 14

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SI5110-H-BL

Manufacturer Part Number
SI5110-H-BL
Description
IC TXRX SONET/SDH LP HS 99-PBGA
Manufacturer
Silicon Laboratories Inc
Datasheet

Specifications of SI5110-H-BL

Product
PHY
Supply Voltage (max)
1.89 V, 3.47 V
Supply Voltage (min)
1.71 V
Supply Current
0.7 A
Maximum Operating Temperature
+ 85 C
Minimum Operating Temperature
- 20 C
Mounting Style
SMD/SMT
Maximum Power Dissipation
1300 mW
Number Of Channels
1
Package / Case
BGA-99
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
SI5110-H-BL
Manufacturer:
Silicon Laboratories Inc
Quantity:
10 000
S i 5 11 0
The LOS detection circuitry is disabled by tieing the
LOSLVL input to VREF. This forces the LOS output
high.
5.2.3. Slice Level Adjustment
The limiting amplifier allows adjustment of the 0/1
decision threshold, or slice level, to allow optimization of
bit-error-rates (BER) for demanding applications such
as long-haul links. The Si5110 provides two different
modes of slice level adjustment: Absolute Slice mode
and Proportional Slice mode. The mode is selected
using the SLICEMODE input.
In either mode, the slice level is set by applying a dc
voltage to the SLICELVL input. The mapping of the
voltage on the SLICELVL pin to the 0/1 decision
threshold voltage (or slice voltage) depends on the
selected mode of operation.
The SLICELVL mapping for Absolute Slice mode
(SLICEMODE = 0) is given in Figure 6 on page 16. The
linear region of this curve can be approximated by the
following equation:
where V
RXDIN input, V
SLICELVL pin, and VREF is the reference voltage
provided by the Si5110 on the VREF output pin
(nominally 1.25 V).
The SLICELVL mapping for Proportional Slice mode
(SLICEMODE = 1) is given in Figure 7 on page 17. The
linear region of this curve can be approximated by the
following equation:
where V
RXDIN input, V
SLICELVL pin, VREF is the reference voltage provided
by the Si5110 on the VREF output pin, and V
the peak-to-peak voltage level of the receive data signal
applied to the RXDIN input.
The slice level adjustment function can be disabled by
tieing the SLICELVL input to VREF. When slice level
adjustment is disabled, the effective slice level is set to
0 mV relative to internally biased input common mode
voltage for RXDIN.
14
V
LEVEL
LEVEL
LEVEL
V
(
V
LEVEL
(
RXDIN PP
(
V
SLICELVL
is the effective slice level referred to the
is the effective slice level referred to the
SLICELVL
SLICELVL
=
(
[
)
(
V
×
Equation 6
Equation 7
SLICELVL
0.95
(
VREF 0.4
is the voltage applied to the
is the voltage applied to the
)
]
[
0.03
×
(
VREF 0.4
×
)
) 0.375
V
×
RXDIN PP
×
RXDIN(PP)
(
)
) 0.005
)
×
)
]
Rev. 1.4
is
5.3. Clock and Data Recovery (CDR)
The Si5110 uses an integrated CDR to recover clock
and data from a non-return to zero (NRZ) signal input on
RXDIN. The recovered clock is used to regenerate the
incoming data by sampling the output of the limiting
amplifier at the center of the NRZ bit period.
5.3.1. Sample Phase Adjustment
In
introduced by the transmission medium, it may be
desirable to recover data by sampling at a point that is
not at the center of the data eye. The Si5110 provides a
sample phase adjustment
adjustment of the CDR sampling phase across the NRZ
data period. When sample phase adjustment is
enabled, the sampling instant used for data recovery
can be moved over a range of approximately ±22 ps
relative to the center of the incoming NRZ bit period.
The sample phase is set by applying a dc voltage to the
PHASEADJ input. The mapping of the voltage present
on the PHASEADJ input to the sample phase sampling
offset is given in Figure 8. The linear region of this curve
can be approximated by the following equation:
where Phase Offset is the sampling offset in
picoseconds from the center of the data eye, V
is the voltage applied to the PHASEADJ pin, and VREF
is the reference voltage provided by the Si5110 on the
VREF output pin (nominally 1.25 V). A positive phase
offset adjusts the sampling point to lead the default
sampling point (the center of the data eye) and a
negative phase offset adjusts the sampling point to lag
the default sampling point.
Data recovery using a sampling phase offset is disabled
by tieing the PHASEADJ input to VREF. This forces a
phase offset of 0 ps to be used for data recovery.
5.3.2. Receiver Lock Detect
The Si5110 provides lock-detect circuitry that indicates
whether the PLL has achieved frequency lock with the
incoming data. This circuit compares the frequency of a
divided down version of the recovered clock with the
frequency of the supplied reference clock. The Si5110
will use either REFCLK or TXCLK4IN as the reference
clock input signal, depending on the state of the
REFSEL input. If the (divided) recovered clock
frequency deviates from that of the reference clock by
more than the amount specified in Table 5 on page 9,
the CDR is declared out of lock, and the loss-of-lock
(RXLOL) pin is asserted. In this state, the CDR attempts
to reacquire lock with the incoming data stream. During
Phase Offset 85 ps/V
applications
where
Equation 8
×
(
V
data
PHASEADJ
capability that allows
eye
(
distortions
0.4 VREF
×
PHASEADJ
)
)
are

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