12065E104ZAT2A AVX Corporation, 12065E104ZAT2A Datasheet - Page 6

• Manufacturer Part Number: 12065E104ZAT2A
• Description: Cap Ceramic 0.1uF 50VDC Z5U -20% to 80% SMD 1206 Paper T/R
• Manufacturer: AVX Corporation
• Type: Flatr
• Series: 1206r

Specifications of 12065E104ZAT2A

• Package/case: 1206
• Mounting: Surface Mount
• Capacitance Value: 0.1 uF
• Dielectric: Z5U
• Voltage: 50 Vdc
• Product Length: 3.2 mm
• Product Height: 1.5(Max) mm
• Product Depth: 1.6 mm
• Tolerance: -20 to 80 %
• Dielectric Characteristic: Z5U
• Capacitance: 0.1µF
• Capacitance Tolerance: +80, -20%
• Voltage Rating: 50VDC
• Capacitor Case Style: 1206
• No. Of Pins: 2
• Capacitor Mounting: SMD
• Rohs Compliant: Yes
• Case Code: 1206
• Case Size: 1206
• Material, Element: Ceramic
• Termination: SMT
• Operating Temperature Range: + 10 C to + 85 C
• Temperature Coefficient / Code: Z5U
• Package / Case: 1206 (3216 metric)
• Product: General Type MLCCs
• Dimensions: 1.6 mm (0.063 in) W x 3.2 mm (0.126 in) L
• Dissipation Factor Df: 4
• Termination Style: SMD/SMT
• Lead Free Status / Rohs Status: RoHS Compliant part

C0G (NP0) Dielectric
Specifications and Test Methods
Resistance to
Resistance to
Operating Temperature Range
Solder Heat
Load Life
Humidity
Stresses
Thermal
Flexure
Shock
Load
Insulation Resistance
Dielectric Strength
Parameter/Test
Capacitance
Solderability
Q
(C=Nominal Cap)
Capacitance
Capacitance
Capacitance
Capacitance
Capacitance
Appearance
Appearance
Appearance
Appearance
Appearance
Resistance
Resistance
Resistance
Resistance
Resistance
Insulation
Insulation
Insulation
Insulation
Insulation
Dielectric
Dielectric
Dielectric
Dielectric
Variation
Variation
Strength
Variation
Strength
Variation
Strength
Variation
Strength
Q
Q
Q
Q
Q
No defects, <25% leaching of either end terminal
≥ 95% of each terminal should be covered
≥10 pF, <30 pF:
≥10 pF, <30 pF:
≤ ±2.5% or ±.25 pF, whichever is greater
≤ ±2.5% or ±.25 pF, whichever is greater
≤ ±3.0% or ± .3 pF, whichever is greater
≤ ±5.0% or ± .5 pF, whichever is greater
±5% or ±.5 pF, whichever is greater
<30 pF: Q≥ 400+20 x Cap Value
No breakdown or visual defects
≥ Initial Value x 0.3 (See Above)
≥ Initial Value x 0.3 (See Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
100,000MΩ or 1000MΩ - µF,
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
NP0 Specification Limits
≥ 30 pF:
≥ 30 pF:
Within specified tolerance
<10 pF:
<10 pF:
≥ Initial Value x 0.3
No visual defects
≥30 pF: Q≥ 1000
-55ºC to +125ºC
whichever is less
with fresh solder
No visual defects
No visual defects
No defects
Q≥ 350
Q≥ 275 +5C/2
Q≥ 200 +10C
Q≥ 350
Q≥ 275 +5C/2
Q≥ 200 +10C
1-5 seconds, w/charge and discharge current
Charge device with 300% of rated voltage for
seconds. Store at room temperature for 24 ± 2
hours before measuring electrical properties.
Dip device in eutectic solder at 260ºC for 60
Step 1: -55ºC ± 2º
Step 2: Room Temp
Step 3: +125ºC ± 2º
Step 4: Room Temp
Repeat for 5 cycles and measure after
24 hours at room temperature
Remove from test chamber and stabilize at
Dip device in eutectic solder at 230 ± 5ºC
Freq.: 1.0 MHz ± 10% for cap ≤ 1000 pF
85% ± 5% relative humidity for 1000 hours
Store in a test chamber set at 85ºC ± 2ºC/
Charge device with twice rated voltage in
Remove from chamber and stabilize at
Charge device with rated voltage for
(+48, -0) with rated voltage applied.
60 ± 5 secs @ room temp/humidity
room temperature for 24 ± 2 hours
test chamber set at 125ºC ± 2ºC
room temperature for 24 hours
Temperature Cycle Chamber
1.0 kHz ± 10% for cap > 1000 pF
for 1000 hours (+48, -0).
Measuring Conditions
Voltage: 1.0Vrms ± .2V
Test Time: 30 seconds
limited to 50 mA (max)
for 5.0 ± 0.5 seconds
before measuring.
before measuring.
Deflection: 2mm
90 mm
1mm/sec
30 ± 3 minutes
≤ 3 minutes
≤ 3 minutes
30 ± 3 minutes
5